C8051F996-GM Silicon Laboratories Inc, C8051F996-GM Datasheet - Page 204
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C8051F996-GM
Manufacturer Part Number
C8051F996-GM
Description
IC MCU 8BIT 8KB FLASH 24QFN
Manufacturer
Silicon Laboratories Inc
Series
C8051F9xxr
Specifications of C8051F996-GM
Program Memory Type
FLASH
Program Memory Size
8KB (8K x 8)
Package / Case
24-UQFN Exposed Pad, 24-HUQFN
Core Processor
8051
Core Size
8-Bit
Speed
25MHz
Connectivity
SMBus (2-Wire/I²C), SPI, UART/USART
Peripherals
Brown-out Detect/Reset, Cap Sense, POR, PWM, Temp Sensor, WDT
Number Of I /o
17
Ram Size
512 x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 3.6 V
Data Converters
A/D 10x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Processor Series
C8051F9x
Core
8051
Data Ram Size
512 B
Interface Type
I2C, SMBus, Enhanced UART, Enhanced SPI
Maximum Clock Frequency
7 KHz
Number Of Programmable I/os
17
Number Of Timers
4
Operating Supply Voltage
2.4 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
PK51, CA51, A51, ULINK2
Development Tools By Supplier
C8051F996DK
Minimum Operating Temperature
- 40 C
On-chip Adc
12 bit, 10 Channel
On-chip Dac
10 bit, 4 Channel
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
Other names
336-1943-5
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
C8051F996-GM
Manufacturer:
SILICON
Quantity:
570
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C8051F99x-C8051F98x
20.2.5. Automatic Gain Control (Crystal Mode Only) and SmaRTClock Bias Doubling
Automatic Gain Control allows the SmaRTClock oscillator to trim the oscillation amplitude of a crystal in
order to achieve the lowest possible power consumption. Automatic Gain Control automatically detects
when the oscillation amplitude has reached a point where it safe to reduce the drive current, therefore, it
may be enabled during crystal startup. It is recommended to enable Automatic Gain Control in most sys-
tems which use the SmaRTClock oscillator in Crystal Mode. The following are recommended crystal spec-
ifications and operating conditions when Automatic Gain Control is enabled:
When using Automatic Gain Control, it is recommended to perform an oscillation robustness test to ensure
that the chosen crystal will oscillate under the worst case condition to which the system will be exposed.
The worst case condition that should result in the least robust oscillation is at the following system condi-
tions: lowest temperature, highest supply voltage, highest ESR, highest load capacitance, and lowest bias
current (AGC enabled, Bias Double Disabled).
To perform the oscillation robustness test, the SmaRTClock oscillator should be enabled and selected as
the system clock source. Next, the SYSCLK signal should be routed to a port pin configured as a push-pull
digital output. The positive duty cycle of the output clock can be used as an indicator of oscillation robust-
ness. As shown in Figure 20.2, duty cycles less than 55% indicate a robust oscillation. As the duty cycle
approaches 60%, oscillation becomes less reliable and the risk of clock failure increases. Increasing the
bias current (by disabling AGC) will always improve oscillation robustness and will reduce the output
clock’s duty cycle. This test should be performed at the worst case system conditions, as results at very
low temperatures or high supply voltage will vary from results taken at room temperature or low supply
voltage.
As an alternative to performing the oscillation robustness test, Automatic Gain Control may be disabled at
the cost of increased power consumption (approximately 200 nA). Disabling Automatic Gain Control will
provide the crystal oscillator with higher immunity against external factors which may lead to clock failure.
Automatic Gain Control must be disabled if using the SmaRTClock oscillator in self-oscillate mode.
Table 20.3 shows a summary of the oscillator bias settings. The SmaRTClock Bias Doubling feature allows
the self-oscillation frequency to be increased (almost doubled) and allows a higher crystal drive strength in
crystal mode. High crystal drive strength is recommended when the crystal is exposed to poor environmen-
tal conditions such as excessive moisture. SmaRTClock Bias Doubling is enabled by setting BIASX2
(RTC0XCN.5) to 1.
204
ESR < 50 k
Load Capacitance < 10 pF
Supply Voltage < 3.0 V
Temperature > –20 °C
Figure 20.2. Interpreting Oscillation Robustness (Duty Cycle) Test Results
25%
Safe Operating Zone
55%
Low Risk of Clock
Rev. 1.0
Failure
60%
High Risk of Clock
Failure
Duty Cycle
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