AMD-K6-2E/400AFR AMD [Advanced Micro Devices], AMD-K6-2E/400AFR Datasheet - Page 142

• Manufacturer Part Number: AMD-K6-2E/400AFR
• Manufacturer: AMD [Advanced Micro Devices]

AMD-K6™-2E Processor Data Sheet
5.46
Pin Attribute
Pin Location
Summary
Sampled
5.47
Pin Attribute
Pin Location
Summary
Sampled
5.48
Pin Attribute
Pin Location
Summary
Driven and Floated
124
TDI (Test Data Input)
TCK (Test Clock)
TDO (Test Data Output)
Input, Internal Pullup
M-34
TCK is the clock for boundary-scan testing using the Test
Access Port (TAP). See “Boundary-Scan Test Access Port
(TAP)” on page 229 for details regarding the operation of the
TAP controller.
The processor always samples TCK, except while TRST# is
asserted.
Input, Internal Pullup
N-35
T D I i s t h e s e r i a l t e s t d a t a a n d i n s t r u c t i o n i n p u t fo r
boundary-scan testing using the Test Access Port (TAP). See
“Boundary-Scan Test Access Port (TAP)” on page 229 for details
regarding the operation of the TAP controller.
The processor samples TDI on every rising TCK edge, but only
while in the Shift-IR and Shift-DR states.
Output
N-33
TDO is the serial test data and instruction out put for
boundary-scan testing using the Test Access Port (TAP). See
“Boundary-Scan Test Access Port (TAP)” on page 229 for details
regarding the operation of the TAP controller.
The processor drives TDO on every falling TCK edge, but only
while in the Shift-IR and Shift-DR states. TDO is floated at all
other times.
Preliminary Information
Signal Descriptions
22529B/0—January 2000
Chapter 5