am45dl3208g Advanced Micro Devices, am45dl3208g Datasheet - Page 43

• Manufacturer Part Number: am45dl3208g
• Description: Stacked Multi-chip Package Mcp Flash Memory And Sram
• Manufacturer: Advanced Micro Devices

TEST CONDITIONS
KEY TO SWITCHING WAVEFORMS
March 12, 2004
Note: Diodes are IN3064 or equivalent
Device
Under
3.0 V
0.0 V
Test
WAVEFORM
Figure 12.
Input
C
L
Figure 13. Input Waveforms and Measurement Levels
Test Setup
Don’t Care, Any Change Permitted
1.5 V
6.2 kΩ
Does Not Apply
3.3 V
INPUTS
P R E L I M I N A R Y
2.7 kΩ
Am45DL3208G
Measurement Level
Output Load
Output Load Capacitance, C
(including jig capacitance)
Input Rise and Fall Times
Input Pulse Levels
Input timing measurement
reference levels
Output timing measurement
reference levels
Changing from H to L
Changing from L to H
Test Condition
Steady
Center Line is High Impedance State (High Z)
Table 18. Test Specifications
Changing, State Unknown
OUTPUTS
L
1.5 V
0.0–3.0
70, 85
1 TTL gate
1.5
1.5
30
5
Output
KS000010-PAL
Unit
pF
ns
V
V
V
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