AT32UC3B0512AU Atmel Corporation, AT32UC3B0512AU Datasheet - Page 592

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AT32UC3B0512AU

Manufacturer Part Number
AT32UC3B0512AU
Description
Manufacturer
Atmel Corporation

Specifications of AT32UC3B0512AU

Flash (kbytes)
512 Kbytes
Pin Count
64
Max. Operating Frequency
60 MHz
Cpu
32-bit AVR
# Of Touch Channels
32
Hardware Qtouch Acquisition
No
Max I/o Pins
44
Ext Interrupts
44
Usb Transceiver
1
Usb Speed
Full Speed
Usb Interface
Device + OTG
Spi
4
Twi (i2c)
1
Uart
3
Ssc
1
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
8
Adc Resolution (bits)
10
Adc Speed (ksps)
384
Resistive Touch Screen
No
Dac Channels
2
Dac Resolution (bits)
16
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
96
Self Program Memory
YES
Dram Memory
No
Nand Interface
No
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
3.0-3.6 or (1.65-1.95+3.0-3.6)
Operating Voltage (vcc)
3.0-3.6 or (1.65-1.95+3.0-3.6)
Fpu
No
Mpu / Mmu
Yes / No
Timers
10
Output Compare Channels
16
Input Capture Channels
6
Pwm Channels
13
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
AT32UC3B0512AU-Z2U
Manufacturer:
ATMEL/爱特梅尔
Quantity:
20 000
27.5.2
27.5.2.1
27.5.2.2
32059L–AVR32–01/2012
Public JTAG Instructions
IDCODE
SAMPLE_PRELOAD
Table 27-9.
The JTAG standard defines a number of public JTAG instructions. These instructions are
described in the sections below.
This instruction selects the 32 bit Device Identification register (DID) as Data Register. The DID
register consists of a version number, a device number, and the manufacturer code chosen by
JEDEC. This is the default instruction after a JTAG reset. Details about the DID register can be
found in the module configuration section at the end of this chapter.
Starting in Run-Test/Idle, the Device Identification register is accessed in the following way:
Table 27-10. IDCODE Details
This instruction takes a snap-shot of the input/output pins without affecting the system operation,
and pre-loading the scan chain without updating the DR-latch. The boundary-scan chain is
selected as Data Register.
Starting in Run-Test/Idle, the Device Identification register is accessed in the following way:
Instruction
DR Size
DR input value
DR output value
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
5. Select the DR Scan path.
6. In Capture-DR: The IDCODE value is latched into the shift register.
7. In Shift-DR: The IDCODE scan chain is shifted by the TCK input.
8. Return to Run-Test/Idle.
Instruction Description (Continued)
Description
Shows the number of bits in the data register chain when this instruction is active.
Example: 34 bits
Shows which bit pattern to shift into the data register in the Shift-DR state when this
instruction is active. Multiple such lines may exist, e.g., to distinguish between
reads and writes.
Example: aaaaaaar xxxxxxxx xxxxxxxx xxxxxxxx xx
Shows the bit pattern shifted out of the data register in the Shift-DR state when this
instruction is active. Multiple such lines may exist, e.g., to distinguish between
reads and writes.
Example: xx xxxxxxxx xxxxxxxx xxxxxxxx xxxxxxeb
Details
00001 (0x01)
p0001
32
xxxxxxxx xxxxxxxx xxxxxxxx xxxxxxxx
Device Identification Register
592

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