TXC-05802AIPQ Transwitch Corporation, TXC-05802AIPQ Datasheet - Page 47

• Manufacturer Part Number: TXC-05802AIPQ
• Manufacturer: Transwitch Corporation

Specifications of TXC-05802AIPQ

• Operating Supply Voltage (typ): 3.3/5V
• Operating Temperature Classification: Industrial
• Package Type: PQFP
• Mounting: Surface Mount
• Pin Count: 208
• Lead Free Status / Rohs Status: Not Compliant

CONTROL STRAPS
* Note: All control straps are active low inputs. They are pulled up internally and will be inactive if left unconnected.
RESET AND TEST PINS
TSTMODE
Symbol*
ABRENA
LMODE2
LMODE1
LMODE0
TSTOUT
DEVHIZ
Symbol
TESTIN
ENARB
UA(4-0)
PHYEN
RESET
SCAN1
SCAN2
TRAN
U32
They must be set low to enable the associated function.
Pin No.
Pin No.
156,
157,
153
207
208
158
154
206
205
204
2-6
48
42
47
44
1
I/O/P
I/O/P
O
I
I
I
I
I
I
I
I
I
I
I
I
I
TTLp
TTLp
TTLp
TTLp
TTLp
TTLp
TTLp
TTLp
Type
Type
TTL
--
--
--
--
--
- 47 -
16-Bit Mode Enable: Active low signal to select the
16-Bit operating mode. The additional 8 data bits are
carried by TRD(7-0) acting as the 8 LSB for cell data
inlet and by TRA(7-0) acting as the 8 LSB for cell data
outlet.
Device High Impedance: Active low signal to set all
outputs to high-impedance (Hi-Z) state.
Enable Arbiter: Active low signal to enable internal
copy of Bus Arbiter and Frame Pulse Generator.
Operating Mode: Three active low signals for selec-
tion of CUBIT- Pro cell Inlet/Outlet operating mode.
Please see Figures 6-9, 11, 12 for details.
Translation Enable: An active low signal to enable
header translation by the CUBIT- Pro .
Unit Address: Five active low device identity straps,
used to identify each CUBIT- Pro device in a system
containing up to 32 devices.
Unit 32: Control strap for setting maximum number of
CUBIT-Pros that can be connected to the CellBus
bus. Set low for 32 CUBIT-Pros, high (or floating) for
16.
PHY Layer Enable: a low enables PHY Layer emula-
tion in UTOPIA and 16-Bit modes
Reset: Active low device reset (minimum duration
300 nanoseconds).
Test Mode: Active low signal to enable device test by
manufacturer. Tie to V
Scan 1: Internal test function. Tie to V
Scan 2: Internal test function. Tie to V
Internal Test Pin: Leave floating.
Internal Test Mode Input: Tie to V
Name/Function
Name/Function
DD5
.
DD5
Ed. 3, November 1999
SS
SS
.
TXC-05802
.
.
CUBIT- Pro
TXC-05802-MB