ST7FDALIF2M6TR STMicroelectronics, ST7FDALIF2M6TR Datasheet - Page 142

• Manufacturer Part Number: ST7FDALIF2M6TR
• Description: IC MCU 8BIT 8K FLASH 20-SOIC
• Manufacturer: STMicroelectronics
• Series: ST7r

Specifications of ST7FDALIF2M6TR

• Core Processor: ST7
• Core Size: 8-Bit
• Speed: 8MHz
• Connectivity: DALI, SPI
• Peripherals: LVD, POR, PWM, WDT
• Number Of I /o: 15
• Program Memory Size: 8KB (8K x 8)
• Program Memory Type: FLASH
• Eeprom Size: 256 x 8
• Ram Size: 384 x 8
• Voltage - Supply (vcc/vdd): 2.4 V ~ 5.5 V
• Data Converters: A/D 7x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 20-SOIC (7.5mm Width)
• Processor Series: ST7DALI
• Core: ST7
• Data Bus Width: 8 bit
• Data Ram Size: 384 B
• Interface Type: DALI, SPI
• Maximum Clock Frequency: 8 MHz
• Number Of Programmable I/os: 15
• Number Of Timers: 3
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• Development Tools By Supplier: ST7FLITE-SK/RAIS, ST7DALI-EVAL, ST7MDT10-DVP3, ST7MDT10-EMU3, STX-RLINK
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 10 bit, 7 Channel / 13 bit, 7 Channel
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Electrical characteristics
20.7.2
20.7.3
Table 83.
1.
142/171
V
Symbol
ESD(HBM)
Data based on characterization results, not tested in production.
Electrostatic discharge voltage
(Human Body Model)
Electromagnetic interference (EMI)
Based on a simple application running on the product (toggling 2 LEDs through the I/O
ports), the product is monitored in terms of emission. This emission test is in line with the
norm SAE J 1752/3 which specifies the board and the loading of each pin.
Table 82.
1.
Absolute maximum ratings (electrical sensitivity)
Based on two different tests (ESD and LU) using specific measurement methods, the
product is stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts*(n+1) supply pin). This test
conforms to the AEC-Q100-002 standard.
Absolute maximum ratings
Static latch-up (LU)
2 complementary static tests are required on six parts to assess the latch-up performance.
●
●
These tests are compliant with the EIA/JESD 78 IC latch-up standard.
Table 84.
Symbol
Symbol
S
Data based on characterization results, not tested in production.
EMI
LU
A supply overvoltage (applied to each power supply pin)
A current injection (applied to each input, output and configurable I/O pin)
Peak level
Ratings
Parameter
Static latch-up class
EMI data
Electrical sensitivities
(1)
Parameter
V
SO20 package,
conforming to SAE J
1752/3
DD
=5 V, T
T
conforming to AEC-Q100-
002
Conditions
A
=+25°C
A
=+25° C,
Conditions
T
A
=+25° C conforming to JESD 78
0.1 MHz to 30 MHz
30 MHz to 130 MHz
130 MHz to 1 GHz
SAE EMI Level
frequency band
Monitored
Conditions
Class
H1C
MHz
[f
8/4
3.5
31
25
9
OSC2
Max vs.
Maximum
value
4000
/f
CPU
MHz
16/8
ST7DALIF2
(1)
17
36
27
4
II level A
]
Class
dBμV
Unit
Unit
-
V