APA075-BGB ACTEL [Actel Corporation], APA075-BGB Datasheet - Page 17
APA075-BGB
Manufacturer Part Number
APA075-BGB
Description
ProASIC Flash Family FPGAs
Manufacturer
ACTEL [Actel Corporation]
Datasheet
1.APA075-BGB.pdf
(174 pages)
- Current page: 17 of 174
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Boundary Scan (JTAG)
ProASIC
1149.1, which defines a set of hardware architecture and
mechanisms for cost-effective, board-level testing. The
basic ProASIC
of the TAP (test access port), TAP controller, test data
registers, and instruction register
circuit supports all mandatory IEEE 1149.1 instructions
(EXTEST, SAMPLE/PRELOAD and BYPASS) and the
optional IDCODE instruction
Each test section is accessed through the TAP, which has
five associated pins: TCK (test clock input), TDI and TDO
(test data input and output), TMS (test mode selector)
and TRST (test reset input). TMS, TDI and TRST are
equipped with pull-up resistors to ensure proper
operation when no input data is supplied to them. These
Figure 1-12 • ProASIC
Table 1-6 •
EXTEST
SAMPLE/PRELOAD
IDCODE
PLUS
Boundary-Scan Opcodes
devices are compatible with IEEE Standard
PLUS
boundary-scan logic circuit is composed
PLUS
JTAG Boundary Scan Test Logic Circuit
(Table
1-6).
Hex Opcode
(Figure
I/O
I/O
00
01
0F
1-12). This
I/O
I/O
v5.7
I/O
I/O
Bypass Register
pins are dedicated for boundary-scan test usage. Actel
recommends that a nominal 20 kΩ pull-up resistor is
added to TDO and TCK pins.
The TAP controller is a four-bit state machine (16 states)
that operates as shown in
’1’s and ‘0’s represent the values that must be present at
TMS at a rising edge of TCK for the given state transition
to occur. IR and DR indicate that the instruction register
or the data register is operating in that state.
ProASIC
once for complete boundary-scan functionality to be
available. Prior to being programmed, EXTEST is not
available. If boundary-scan functionality is required prior
to programming, refer to online
Actel website and search for ProASIC
Table 1-6 •
CLAMP
BYPASS
Device
I/O
I/O
Logic
PLUS
Boundary-Scan Opcodes
devices have to be programmed at least
I/O
I/O
Test Data
Registers
ProASIC
Figure 1-13 on page
technical support
PLUS
Hex Opcode
PLUS
Flash Family FPGAs
BSDL.
05
FF
1-12. The
on the
1-11
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