SAM3N0C Atmel Corporation, SAM3N0C Datasheet - Page 203

• Manufacturer Part Number: SAM3N0C
• Manufacturer: Atmel Corporation

11.4
11011A–ATARM–04-Oct-10
Debug and Test Pin Description
Figure 11-3. Application Test Environment Example
Table 11-1.
Signal Name
NRST
TST
TCK/SWCLK
TDI
TDO/TRACESWO
TMS/SWDIO
JTAGSEL
Debug and Test Signal List
SAM3-based Application Board In Test
Connector
JTAG
Probe
JTAG
Function
Microcontroller Reset
Test Select
Test Clock/Serial Wire Clock
Test Data In
Test Data Out/Trace Asynchronous
Data Out
Test Mode Select/Serial Wire
Input/Output
JTAG Selection
SAM3
Chip n
SWD/JTAG
Reset/Test
Test Adaptor
Chip 2
Chip 1
Tester
Input/Output
Output
Type
Input
Input
Input
Input
Input
Active Level
SAM3N
High
Low
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