ST7FL15F1MAE STMICROELECTRONICS [STMicroelectronics], ST7FL15F1MAE Datasheet - Page 112

• Manufacturer Part Number: ST7FL15F1MAE
• Description: 8-bit MCU for automotive with single voltage Flash/ROM memory, data EEPROM, ADC, 5 timers, SPI
• Manufacturer: STMICROELECTRONICS [STMicroelectronics]

ST7L15, ST7L19
EMC CHARACTERISTICS (cont’d)
13.7.3 Absolute Maximum Ratings (Electrical
Sensitivity)
Based on two different tests (ESD and LU) using
specific measurement methods, the product is
stressed in order to determine its performance in
terms of electrical sensitivity. For more details, re-
fer to application note AN1181.
Absolute Maximum Ratings
Notes:
1. Data based on characterization results, not tested in production.
13.7.3.2 Static and Dynamic Latch-Up (LU)
Three complementary static tests are required on
six parts to assess the latch-up performance. A
supply overvoltage (applied to each power supply
pin) and a current injection (applied to each input,
Electrical Sensitivities
Notes:
1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the JEDEC spec-
ifications, which means when a device belongs to Class A it exceeds the JEDEC standard. Class B strictly covers all the
JEDEC criteria (international standard).
112/138
V
V
V
LU
DLU
ESD(HBM)
ESD(MM)
ESD(CDM)
Symbol
Symbol
Electro-static discharge voltage (Human Body Model)
Electro-static discharge voltage (Machine Model)
Electro-static discharge voltage (Charge Device Model)
Static latch-up class
Dynamic latch-up class
Parameter
Ratings
T
T
V
A
A
DD
= 25°C
= 125°C
= 5.5V, f
13.7.3.1 Electro-Static Discharge (ESD)
Electro-Static Discharges (a positive then a nega-
tive pulse separated by 1 second) are applied to
the pins of each sample according to each pin
combination. The sample size depends on the
number of supply pins in the device (3 parts*(n+1)
supply pin). Two models can be simulated: Human
Body Model and Machine Model. This test con-
forms to the JESD22-A114A/A115A standard.
output and configurable I/O pin) are performed on
each sample. This test conforms to the EIA/JESD
78 IC latch-up standard. For more details, refer to
application note AN1181.
OSC
Conditions
= 4 MHz, T
Conditions
T
A
A
= 25°C
= 25°C
Maximum value
8000
1000
400
Class
A
A
1)
1)
Unit
V