LPC2917/01 NXP [NXP Semiconductors], LPC2917/01 Datasheet - Page 69

• Manufacturer Part Number: LPC2917/01
• Description: ARM9 microcontroller with CAN and LIN
• Manufacturer: NXP [NXP Semiconductors]

NXP Semiconductors
Table 35.
V
ground; positive currents flow into the IC; unless otherwise specified.
[1]
[2]
[3]
[4]
LPC2917_19_01_2
Preliminary data sheet
Symbol
Jitter specification for CAN
t
jit(cc)(p-p)
DD(CORE)
All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at T
temperature on wafer level. Cased products are tested at T
test conditions to cover the specified temperature and power supply voltage range.
See
This parameter is not part of production testing or final testing, hence only a typical value is stated.
Oscillator start-up time depends on the quality of the crystal. For most crystals it takes about 1000 clock pulses until the clock is fully
stable.
Table
= V
Dynamic characteristics
26.
DD(OSC_PLL)
Parameter
cycle to cycle jitter
(peak-to-peak value)
; V
Fig 25. Low-power ring oscillator thermal characteristics
DD(IO)
f
ref(RO)
(kHz)
= 2.7 V to 3.6 V; V
520
510
500
490
480
40
…continued
Conditions
on CAN TXDC pin
Rev. 02 — 17 June 2009
DDA(ADC3V3)
15
amb
= 25 C (final testing). Both pre-testing and final testing use correlated
= 3.0 V to 3.6 V; all voltages are measured with respect to
LPC2917/01; LPC2919/01
10
[1]
[3]
ARM9 microcontroller with CAN and LIN
Min
-
35
Typ
0.4
60
temperature ( C)
1.9 V
1.8 V
1.7 V
Max
1
002aae373
© NXP B.V. 2009. All rights reserved.
amb
= 85 C ambient
85
Unit
ns
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