MFRC52201HN1/TRAYB NXP [NXP Semiconductors], MFRC52201HN1/TRAYB Datasheet - Page 81

• Manufacturer Part Number: MFRC52201HN1/TRAYB
• Description: Contactless reader IC
• Manufacturer: NXP [NXP Semiconductors]

NXP Semiconductors
MFRC522_33
Product data sheet
PUBLIC
16.1.3.1 Example: Output test signals TestDAC1 and TestDAC2
16.1.3.2 Example: Output test signals Corr1 and MinLevel
Table 158. Test signal descriptions
The AnalogTestReg register is set to 11h. The output on pin AUX1 has the test signal
TestDAC1 and the output on pin AUX2 has the test signal TestDAC2. The signal values of
TestDAC1 and TestDAC2 are controlled by the TestDAC1Reg and TestDAC2Reg registers.
Figure 28
TestDAC1Reg register is programmed with a slope defined by values 00h to 3Fh and the
TestDAC2Reg register is programmed with a rectangular signal defined by values 00h and
3Fh.
Figure 29
The AnalogTestReg register is set to 24h.
AnalogSelAux1[3:0]
or
AnalogSelAux2[3:0]
value
1101
1110
1111
Fig 28. Output test signals TestDAC1 on pin AUX1 and TestDAC2 on pin AUX2
(1) TestDAC1 (500 mV/div) on pin AUX1.
(2) TestDAC2 (500 mV/div) on pin AUX2.
shows test signal TestDAC1 on pin AUX1 and TestDAC2 on pin AUX2 when the
shows test signals Corr1 and MinLevel on pins AUX1 and AUX2, respectively.
(1)
(2)
Signal on pin AUX1 or pin AUX2
RxActive
subcarrier detected
TstBusBit
Rev. 3 — 26 October 2009
112133
…continued
Contactless reader IC
100 ms/div
MFRC522
001aak597
© NXP B.V. 2009. All rights reserved.
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