MFRC52201HN1/TRAYB NXP [NXP Semiconductors], MFRC52201HN1/TRAYB Datasheet - Page 63
MFRC52201HN1/TRAYB
Manufacturer Part Number
MFRC52201HN1/TRAYB
Description
Contactless reader IC
Manufacturer
NXP [NXP Semiconductors]
Datasheet
1.MFRC52201HN1TRAYB.pdf
(96 pages)
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NXP Semiconductors
MFRC522_33
Product data sheet
PUBLIC
9.3.4.8 VersionReg register
9.3.4.9 AnalogTestReg register
Table 130. AutoTestReg register bit descriptions
Shows the MFRC522 software version.
Table 131. VersionReg register (address 37h); reset value: xxh bit allocation
Table 132. VersionReg register bit descriptions
Determines the analog output test signal at, and status of, pins AUX1 and AUX2.
Table 133. AnalogTestReg register (address 38h); reset value: 00h bit allocation
Bit
7
6
5 to 4
3 to 0
Bit
Symbol
Access
Bit
7 to 0
Bit
Symbol
Access
Symbol
reserved
AmpRcv
RFT
SelfTest
[3:0]
Symbol
Version[7:0]
7
7
Value Description
-
1
-
-
AnalogSelAux1[3:0]
Rev. 3 — 26 October 2009
6
6
Description
indicates current software version of the MFRC522
Remark: the current version of the MFRC522 is 90h or 91h
reserved for production tests
internal signal processing in the receiver chain is performed
non-linearly which increases the operating distance in communication
modes at 106 kBd
Remark: due to non-linearity, the effect of the RxThresholdReg
register’s MinLevel[3:0] and the CollLevel[2:0] values is also
non-linear
reserved for production tests
enables the digital self test
the self test can also be started by the CalcCRC command; see
Section 10.3.1.4 on page 68
the self test is enabled by 1001b
Remark: for default operation the self test must be disabled by 0000b
R/W
112133
5
5
4
4
Version[7:0]
R
3
3
AnalogSelAux2[3:0]
2
2
Contactless reader IC
R/W
MFRC522
© NXP B.V. 2009. All rights reserved.
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