p4c164-12cwmlf Pyramid Semiconductor Corporation, p4c164-12cwmlf Datasheet - Page 7

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p4c164-12cwmlf

Manufacturer Part Number
p4c164-12cwmlf
Description
Ultra High Speed Static Cmos Rams
Manufacturer
Pyramid Semiconductor Corporation
Datasheet
* including scope and test fixture.
Note:
Because of the high speed of the P4C164/L, care must be taken when
testing this device; an inadequate setup can cause a normal functioning
part to be rejected as faulty. Long high-inductance leads that cause
supply bounce must be avoided by bringing the V
directly up to the contactor fingers. A 0.01 µF high frequency capacitor
is also required between V
AC TEST CONDITIONS
LCC PIN CONFIGURATIONS
Document # SRAM115 REV F
Input Pulse Levels
Input Rise and Fall Times
Input Timing Reference Level
Output Timing Reference Level
Output Load
"L" - STANDARD PIN-OUT
LCC (L5)
Figure 1. Output Load
CC
and ground. To avoid signal reflections,
See Figures 1 and 2
GND to 3.0V
CC
and ground planes
1.5V
1.5V
3ns
"LS" - SPECIAL PIN-OUT
LCC (L5)
TRUTH TABLE
proper termination must be used; for example, a 50
should be terminated into a 50
the comparator input, and a 116
D
Mode
Standby
Standby
D
Disabled
Read
Write
OUT
OUT
to match 166
CE
CE
CE
CE
CE
H
X
L
L
L
Figure 2. Thevenin Equivalent
1
(Thevenin Resistance).
CE
H
H
H
X
L
2
OE
OE
OE
OE
OE
H
X
X
X
L
load with 1.73V (Thevenin Voltage) at
resistor must be used in series with
WE
WE
WE
WE
WE
LCC (L6)
H
H
X
X
L
High Z Standby
High Z Standby
High Z Active
High Z Active
D
I/O
OUT
test environment
Page 7 of 16
Power
Active
P4C164

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