ADC1415S NXP Semiconductors, ADC1415S Datasheet - Page 25

• Manufacturer Part Number: ADC1415S
• Description: Single 14-bit ADC
• Manufacturer: NXP Semiconductors

NXP Semiconductors
ADC1415S_SER_3
Preliminary data sheet
11.5.3 Data valid (DAV) output clock
11.5.4 Out-of-Range (OTR)
11.5.5 Digital offset
11.5.6 Test patterns
Table 13.
A data valid output clock signal (DAV) is provided that can be used to capture the data
delivered by the ADC1415S. Detailed timing diagrams for CMOS and LVDS DDR modes
are provided in
An out-of-range signal is provided on pin OTR. The latency of OTR is fourteen clock
cycles. The OTR response can be speeded up by enabling Fast OTR (bit FASTOTR = 1;
see
Fast OTR detection threshold (below full scale) can be programmed via bits
FASTOTR_DET[2:0].
Table 14.
By default, the ADC1415S delivers output code that corresponds to the analog input.
However it is possible to add a digital offset to the output code via the SPI (bits
DIG_OFFSET[5:0]; see
For test purposes, the ADC1415S can be configured to transmit one of a number of
predefined test patterns (via bits TESTPAT_SEL[2:0]; see
can be defined by the user (TESTPAT_USER; see
when TESTPAT_SEL[2:0] = 101. The selected test pattern will be transmitted regardless
of the analog input.
LVDS_INT_TER[2:0]
101
110
111
FASTOTR_DET[2:0]
000
001
010
011
100
101
110
111
Table
29). In this mode, the latency of OTR is reduced to only four clock cycles. The
LVDS DDR output register 2
Fast OTR register
Figure 4
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ADC1415S series; input buffer; CMOS or LVDS DDR digital outputs
Rev. 03 — 12 April 2010
Table
and
Figure 5
25).
respectively.
…continued
Resistor value (Ω)
100
81
60
Detection level (dB)
−20.56
−16.12
−11.02
−7.82
−5.49
−3.66
−2.14
−0.86
Table 27
ADC1415S series
Table
and
26). A custom test pattern
Table
28) and is selected
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