ADE7569ASTZF16 Analog Devices Inc, ADE7569ASTZF16 Datasheet - Page 79

• Manufacturer Part Number: ADE7569ASTZF16
• Description: IC ENERGY METER MCU 16K 64LQFP
• Manufacturer: Analog Devices Inc

Specifications of ADE7569ASTZF16

• Applications: Energy Measurement
• Core Processor: 8052
• Program Memory Type: FLASH (16 kB)
• Controller Series: ADE75xx
• Ram Size: 512 x 8
• Interface: I²C, SPI, UART
• Number Of I /o: 20
• Voltage - Supply: 3.135 V ~ 3.465 V
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 64-LQFP
• Ic Function: Single Phase Energy Measurement IC
• Supply Voltage Range: 3.13V To 3.46V, 2.4V To 3.7V
• Operating Temperature Range: -40°C To +85°C
• Digital Ic Case Style: LQFP
• No. Of Pins: 64
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

TEMPERATURE MEASUREMENT
To provide a digital temperature measurement, each ADE7156/
ADE7166/ADE7169/ADE7566/ADE7569 includes a dedicated
ADC. An 8-bit temperature ADC value SFR (TEMPADC,
Address 0xD7) holds the results of the temperature conversion.
The resolution of the temperature measurement is 0.78°C/LSB.
There are two ways to initiate a temperature conversion: a single
temperature measurement or background temperature
measurements.
Single Temperature Measurement
Set the TEMP_ADC_GO bit (Bit 1) in the start ADC measure-
ment SFR (ADCGO, Address 0xD8) to obtain a temperature
measurement (see Table 51). An interrupt is generated when the
conversion is complete and when the temperature measurement
is available in the temperature ADC value SFR (TEMPADC,
Address 0xD7).
Background Temperature Measurements
Background temperature measurements are disabled by default.
To configure the background temperature measurement mode,
set a temperature measurement interval in the peripheral ADC
strobe period SFR (STRBPER, Address 0xF9). Temperature
measurements are then performed periodically in the background
(see Table 49).
When a temperature conversion completes, the new temperature
ADC value is compared to the last temperature ADC value that
created an interrupt. If the absolute difference between the two
values is greater than the setting in the TEMP_DIFF bits in the
temperature and supply delta SFR (DIFFPROG, Address 0xF3),
a TEMPADC interrupt is generated (see Table 50). This allows
temperature measurements to take place completely in the
background, requiring MCU activity only if the temperature
changes more than a configurable delta.
To set up background temperature measurement,
1.
2.
3.
Temperature ADC in PSM0, PSM1, and PSM2
Depending on the operating mode of the ADE7156/ADE7166/
ADE7169/ADE7566/ADE7569, a temperature conversion is
initiated only by certain actions.
•
Initiate a single temperature measurement by setting the
TEMP_ADC_GO bit in the start ADC measurement SFR
(ADCGO, Address 0xD8).
Upon completion of this measurement, configure the
TEMP_DIFF bits in the temperature and supply delta SFR
(DIFFPROG, Address 0xF3) to establish the change in
temperature that triggers an interrupt.
Set up the interval for background temperature measurements
by configuring the TEMP_PERIOD[1:0] bits in the periph-
eral ADC strobe period SFR (STRBPER, Address 0xF9).
In PSM0 operating mode, the 8052 is active. Temperature
measurements are available in the background measurement
mode and by initiating a single measurement.
ADE7116/ADE7156/ADE7166/ADE7169/ADE7566/ADE7569
Rev. B | Page 79 of 152
•
•
The temperature ADC value SFR (TEMPADC, Address 0xD7) is
updated with a new value only when a temperature ADC
interrupt occurs.
Temperature ADC Interrupt
The temperature ADC can generate an ADC interrupt when at
least one of the following conditions occurs:
•
•
When the ADC interrupt occurs, a new value is available in the
temperature ADC value SFR (TEMPADC, Address 0xD7). Note
that there is no flag associated with this interrupt.
BATTERY MEASUREMENT
To provide a digital battery measurement, each ADE7156/
ADE7166/ADE7169/ADE7566/ADE7569 includes a dedicated
ADC. The battery measurement is available in the 8-bit battery
ADC value SFR (BATADC, Address 0xDF). The battery
measurement has a resolution of 14.6 mV/LSB. A battery
conversion can be initiated by two methods: a single battery
measurement or background battery measurements.
Single Battery Measurement
Set the BATT_ADC_GO bit (Bit 0) in the start ADC measurement
SFR (ADCGO, Address 0xD8) to obtain a battery measurement.
An interrupt is generated when the conversion is done and
when the battery measurement is available in the battery ADC
value SFR (BATADC, Address 0xDF).
Background Battery Measurements
To configure background measurements for the battery, establish
a measurement interval in the peripheral ADC strobe period
SFR (STRBPER, Address 0xF9). Battery measurements are then
performed periodically in the background (see Table 49).
When a battery conversion completes, the battery ADC value is
compared to the low battery threshold, established in the battery
detection threshold SFR (BATVTH, Address 0xFA). If the battery
ADC value is below this threshold, a low battery flag is set. This
low battery flag is the FBAT bit (Bit 2) in the power manage-
ment interrupt flag SFR (IPSMF, Address 0xF8), used for power
supply management.
In PSM1 operating mode, the 8052 is active, and the part is
battery powered. Single temperature measurements can be
initiated by setting the TEMP_ADC_GO bit in the start
ADC measurement SFR (ADCGO, Address 0xD8).
Background temperature measurements are not available.
In PSM2 operating mode, the 8052 is not active.
Temperature conversions are available through the
background measurement mode only.
The difference between the new temperature ADC value and
the last temperature ADC value generating an ADC interrupt
is larger than the value set in the TEMP_DIFF bits.
The temperature ADC conversion, initiated by setting the
start ADC measurement SFR (ADCGO, Address 0xD8),
finishes.