stc3800 Connor-Winfield VCXOs, stc3800 Datasheet - Page 26

• Manufacturer Part Number: stc3800
• Description: Integrated - Stratum 3e Timing Source
• Manufacturer: Connor-Winfield VCXOs

Performance Specifications
Performance Definitions
Jitter and Wander
significant instants of a digital signal from their ideal positions in time”. They are therefore the phase or position in time
modulations of a digital signal’s transitions’s transitions relative to their ideal positions. These phase modulations can in
turn be characterized in terms of their amplitude and frequency. Jitter is defined as those phase variations at rates
above 10 Hz, and wander as those variations at rates below 10 Hz.
Fractional frequency offset and drift
(from the nominal or desired frequency) to the desired frequency. It is typically expressed as (n parts in 10
Drift is the measure of a clock’s frequency offset over time. It is expressed the same way as offset.
Time Interval Error (TIE)
signal relative to an ideal signal over a particular time period. It is typically measured in nS. TIE is set to zero at the
start of a measurement, and thus represents the phase change since the beginning of the measurement.
Maximum Time Interval Error (MTIE)
time delay of a signal for a given window of time, called the observation interval ( ). Therefore it is the largest peak-to-
peak TIE in any observation interval of length
useful measure of phase transients, maximum wander and frequency offsets. MTIE increases monotonically with
increasing observation interval.
Time Deviation (TDEV)
TDEV( ) is the RMS of filtered TIE, where the bandpass filter is centered on a frequency of 0.42/ .
STC3800 performance
Input Jitter Tolerance
an indication of improper operation. GR-1244 and ITU-813 requirements specify jitter amplitude v.s. jitter frequency for
jitter tolerance. The STC3800 device provides jitter tolerance that meets the specified requirements.
Input Wander Tolerance
generating an indication of improper operation. GR-1244 and ITU-813 requirements specify input wander TDEV
v.s. integration time as shown below.
The STC3800 device provides wander tolerance that meets these requirements.
Phase Transient Tolerance
tolerate without generating an indication of improper operation. The phase transient tolerance is specified in MTIE(nS)
v.s. observation
time from .001 to 100 seconds, as shown below.
The STC3800 will tolerate all reference input transients within the GR-1244 specification.
– Jitter and wander are defined respectively as “the short-term and long-term variations of the
– Input jitter tolerance is the amount of jitter at its input a clock can tolerate before generating
– TDEV is a measurement of wander that characterizes the spectral content of phase noise.
– TIE is a measure of wander and is defined as the variation in the time delay of a given
– Input wander tolerance is the amount of wander at its input a clock can tolerate before
– GR-1244 specifies maximum reference input phase transients that a clock system must
Observation time S (Seconds)
0.001326
0.0164 < S < 1.97
1.97
© Copyright 2001 The Connor-Winfield Corp. All Rights Reserved
Preliminary Data Sheet #: TM061
S
Integration Time,
0.05
10 <
1000
– MTIE is a measurement of wander that finds the peak-to-peak variations in the
– The fractional frequency offset of a clock is the ratio of the frequency error
S < 0.0164
< 1000
< 10
within the entire measurement window of TIE data. MTIE is therefore a
(seconds)
925 + 4600 x S (only for Stratum 3)
10,000 (only for Stratum 3)
MTIE (nanoseconds)
TDEV (nS)
Page 26 of 48
61,000 x S
31.6 x
100
N/A
Specifications subject to change without notice
0.5
Rev: P06
x
), or (n x 10
Date: 11/22/04
-x
).