CYIL1SM4000AA-GDC Cypress Semiconductor Corp, CYIL1SM4000AA-GDC Datasheet - Page 27

• Manufacturer Part Number: CYIL1SM4000AA-GDC
• Description: SENSOR IMAGE 4MP CMOS 127-PGA
• Manufacturer: Cypress Semiconductor Corp
• Type: CMOS Imagingr

Specifications of CYIL1SM4000AA-GDC

• Package / Case: 127-PGA
• Pixel Size: 12µm x 12µm
• Active Pixel Array: 2048H x 2048V
• Frames Per Second: 15
• Voltage - Supply: 2.5V, 3.3V
• Operating Supply Voltage: 2.5 V
• Maximum Operating Temperature: + 60 C
• Minimum Operating Temperature: 0 C
• Image Size: 2048 H x 2048 V
• Color Sensing: Monochrome
• Package: 127CPGA
• Operating Temperature: 0 to 60 °C
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Contains lead / RoHS non-compliant
• Other names: LUPA-4000-M; LUPA-4000-M

Acronyms
Document Number: 38-05712 Rev. *F
ADC
AFE
ANSI
BGA
BL
CDM
CDS
CIS
CMOS
CMY
CRC
DAC
DDR
DFT
DNL
DSNU
EIA
ESD
FE
FF
FOT
FPN
FPS
FS
HBM
HMUX
I2C
IEEE
IMG
Acronym
American National Standards Institute
black pixel data
CMOS image sensor
cyan magenta yellow
Electronic Industries Alliance
electrostatic discharge
Human Body Model
analog-to-digital converter
analog front end
ball grid array
Charged Device Model
correlated double sampling
complementary metal oxide semiconductor
cyclic redundancy check
digital-to-analog converter
double data rate
design for test
differential nonlinearity
dark signal nonuniformity
frame end
fill factor
frame overhead time
fixed pattern noise
frames per second
frame start
horizontal multiplexer
inter-integrated circuit
Institute of Electrical and Electronics Engineers
regular pixel data
Description
INL
IP
JTAG
LE
LS
LSB
LVDS
MBS
MSB
MTF
NDR
NIR
PGA
PLS
PRBS
PRNU
QE
RGB
RMS
ROI
ROT
S/H
SNR
SPI
TAP
TBD
TIA
TR
uPGA
Acronym
integral nonlinearity
intellectual property
Joint Test Action Group
line end
line start
least significant bit
low-voltage differential signaling
mixed boundary scan
most significant bit
modulation transfer function
nondestructive readout
near infrared
programmable gain amplifier
parasitic light sensitivity
pseudo-random binary sequence
pixel random nonuniformity
quantum efficiency
red green blue
root mean square
region of interest
row overhead time
sample and hold
signal-to-noise ratio
serial peripheral interface
test access port
to be determined
Telecommunications Industry Association
training pattern
micro pin grid array
Description
CYIL1SM4000AA
Page 27 of 32