HS7046EPH60H Renesas Electronics America, HS7046EPH60H Datasheet - Page 86

• Manufacturer Part Number: HS7046EPH60H
• Description: DEV EMULATOR BASE SH7046
• Manufacturer: Renesas Electronics America
• Series: SuperH®r
• Type: Microcontrollerr

Specifications of HS7046EPH60H

• Contents: E6000 Emulator and CD-ROM
• For Use With/related Products: SH7046
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

12. Combination
13. Parallel Access
14. PC Coverage
Normal stopped at Wed Jan 22 09:46:55 2003
Tests run for 0H:3M:12S
Summary:
64
10. G/A Parallel RAM Monitor
11. G/A Trace Function
12. Combination
13. Parallel Access
14. PC Coverage
1. Main Board Access
2. Emulation Board Access
3. Evaluation Board Access
4. Basic Function
5. GO to BREAK Time Measurement
6. Emulation Monitor
7. G/A Break Function
8. G/A Performance Analysis Function : 0 Error(s)
9. G/A Monitor Function
Tests performed 1 time(s).
01) B to A Time Measurement( FPGA counter ) ...................OK
02) B to A Time Measurement( G/A counter ) ....................OK
03) D to C Time Measurement( G/A counter ) ....................OK
01) INROM Parallel Read Access(Byte/Long) .....................OK
02) INROM Parallel Write Access(Byte/Long) ....................OK
03) ERAM Parallel Read Access(Byte/Long) ......................OK
04) ERAM Parallel Write Access(Byte/Long) .....................OK
05) ERAM Parallel Write Access(Byte/Word/Long) ................OK
06) ERAM Parallel Read Access(Byte/Word/Long) .................OK
07) INROM Parallel Write Access(Byte/Word/Long) ...............OK
08) INROM Parallel Read Access(Byte/Word/Long) ................OK
01) PC Coverage ...............................................OK
: 0 Error(s)
: 0 Error(s)
: 0 Error(s)
: 0 Error(s)
: 0 Error(s)
: 0 Error(s)
: 0 Error(s)
: 0 Error(s)
: 0 Error(s)
: 0 Error(s)
: 0 Error(s)
: 0 Error(s)
: 0 Error(s)
Shows the time when the
diagnostic program has
ended.
Shows the execution time
of the diagnostic program.
Shows the total of the
number of errors occurred
in each test item.