MCIMX35WPDKJ Freescale Semiconductor, MCIMX35WPDKJ Datasheet - Page 55

BOARD DEV FOR I.MX35

MCIMX35WPDKJ

Manufacturer Part Number
MCIMX35WPDKJ
Description
BOARD DEV FOR I.MX35
Manufacturer
Freescale Semiconductor
Series
i.MX35r
Type
MPUr
Datasheets

Specifications of MCIMX35WPDKJ

Contents
Module and Misc Hardware
Processor To Be Evaluated
i.MX35
Processor Series
i.MX35
Data Bus Width
32 bit
Interface Type
RS-232, Ethernet, USB, CAN, JTAG
Core
ARM11
For Use With/related Products
i.MX35
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Freescale Semiconductor
SD21 DQS – DQ Skew (defines the Data valid window in read cycles related to DQS).
SD22 DQS DQ HOLD time from DQS
SD23 DQS output access time from SDCLK posedge
ID
DQS (input)
DQ (input)
SDCLK
SDCLK
Figure 36. Mobile DDR SDRAM DQ versus DQS and SDCLK Read Cycle Timing Diagram
SDRAM CLK and DQS-related parameters are measured from the 50%
point—that is, “high” is defined as 50% of signal value and “low” is defined
as 50% of signal value.
The timing parameters are similar to the ones used in SDRAM data sheets.
Table 41
the ESDCTL at the negative edge of SDCLK, and the parameters are
measured at maximum memory frequency.
SDRAM CLK and DQS-related parameters are measured from the 50%
point—that is, “high” is defined as 50% of signal value, and “low” is
defined as 50% of signal value.
The timing parameters are similar to the ones used in SDRAM data sheets.
Table 42
the ESDCTL at the negative edge of SDCLK, and the parameters are
measured at maximum memory frequency.
i.MX35 Applications Processors for Industrial and Consumer Products, Rev. 9
Table 42. Mobile DDR SDRAM Read Cycle Timing Parameters
indicates SDRAM requirements. All output signals are driven by
indicates SDRAM requirements. All output signals are driven by
SD23
SD21
Data
Parameter
SD22
Data
NOTE
NOTE
Data
Data
Data
Data
tDQSCK
Symbol
tDQSQ
tQH
Data
Min. Max. Unit
2.3
Data
0.85
6.7
ns
ns
ns
55

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