E981.12A39BB ELMOS Semiconductor, E981.12A39BB Datasheet - Page 5

• Manufacturer Part Number: E981.12A39BB
• Description: Interface - Specialized Dual I/O Link Master Transciever
• Manufacturer: ELMOS Semiconductor

Specifications of E981.12A39BB

• Rohs: yes
• Product Type: Dual I/O link Master Transceiver
• Operating Supply Voltage: 3.3 V
• Supply Current: 5.5 mA
• Maximum Operating Temperature: + 105 C
• Mounting Style: SMD/SMT
• Package / Case: QFN-44
• Minimum Operating Temperature: - 40 C

Dual IO-Link Master Transceiver with UARTS
ADVANCE PRODUCT INFORMATION - JUL 26, 2011
3 Operating Conditions
3.1
Stresses beyond these absolute maximum ratings listed below may cause permanent damage to the
device. These are stress ratings only; operation of the device at these or any other conditions beyond
those listed in the operational sections of this document is not implied.
Exposure to absolute maximum rated conditions for extended periods may affect device reliability.
All voltages referred to ground (GND). Currents flowing into terminals are signed as positive, those
drawn out of a terminal are negative.
PGND1, PGND2, GND1 and the package exposed pad must be soldered to the same GND potential.
This document contains information on a new product. ELMOS Semiconductor AG reserves the right to change specifications and information herein without notice.
ELMOS Semiconductor AG
DC voltage at pin VDDH
Transient voltage at pin VDDH
(ESD, burst, surge)
DC input voltage at pins CQ_INx
DC input voltage at pins CQ_OUTx
DC voltage at pins Lx, SENSE_Lx,
DR_Lx
Synchronous transient voltage at pins
CQ_OUTx and Lx
Continuous DC voltage at VDD
Voltage range for digital interface pins
RXDx, TXDx, TXENx, INTN, MISO,
MOSI, SCLK, SCSN
Maximum IO current at each pin, if not
specified otherwise
Junction temperature
Storage temperature
ESD protection at pins CQ_OUTx and
CQ_INx
ESD protection at pin VDDH
ESD protection at pins CQ_OUTx and
CQ_INx
ESD protection at pin VDDH
ESD protection at all other pins
Absolute Maximum Ratings
Description
Table 2: Absolute Maximum Ratings
continuous
t < 500us
continuous
continuous
continuous
t < 500us
continuous
continuous
continuous
AEC-Q100-002
R=1.5kΩ, C=100pF
chip level test
AEC-Q100-002
R=1.5kΩ, C=100pF
chip level test
IEC 61000-4-2
R=330Ω, C=150pF
IEC 61000-4-2
R=330Ω, C=150pF
AEC-Q100-002
R=1.5kΩ, C=100pF
chip level test
Data Sheet 5 / 44
Condition
V
V
V
V
V
V
Symbol
VDDH_ESD_HB
V
V
CQ_ESD_HBM
pin_ESD_HBM
V
L_CTRL,trans
V
CQ_OUT_dc
VDDH_ESD
I
CQ_IN_dc
SUP,trans
V
V
T
IO_LUP
CQ_ESD
L_CTRL
V
T
SUP
VDD
STG
M
IF
J
QM-No.: 25DS0069E.00
Min
-0.3
-0.3
-0.3
-0.3
-0.3
-0.3
-0.3
-10
-40
-5
6
6
6
6
2
Max
+0.3
+0.3
+0.3
V
150
150
V
3.6
40
60
40
60
10
DDH
V
E981.12
DD
Unit
mA
kV
kV
kV
kV
kV
°C
°C
V
V
V
V
V
V
V
V