LUCL9310AP-D AGERE [Agere Systems], LUCL9310AP-D Datasheet - Page 31
LUCL9310AP-D
Manufacturer Part Number
LUCL9310AP-D
Description
Line Interface and Line Access Circuit Full-Feature SLIC,Ringing Relay,and Test Access Device
Manufacturer
AGERE [Agere Systems]
Datasheet
1.LUCL9310AP-D.pdf
(60 pages)
- Current page: 31 of 60
- Download datasheet (998Kb)
July 2001
Test Configurations
* ANSI is a registered trademark of the American National Stan-
Agere Systems Inc.
dards Institue, Inc.
+
V
–
M
900
56.3
Figure 8. Longitudinal PSRR
67.5
67.5
Figure 7. Metallic PSRR
V
V
S
+
–
T/R
10 µF
10 µF
V
PSRR = 20 log
PSRR = 20 log
S
4.7 µF
PT
PR
100
TEST CIRCUIT
PT
PR
4.7 µF
V
(continued)
BAT
V
BASIC
100
CC
TEST CIRCUIT
OR
V
V
--------- -
V
------ -
V
V
V
BAT
BAT
T/R
V
M
S
S
BASIC
CC
OR
OR V
V
DISCONNECT
BYPASS
CAPACITOR
BAT
CC
OR V
Full-Feature SLIC, Ringing Relay, and Test Access Device
DISCONNECT
BYPASS
CAPACITOR
CC
12-2582 (F)
12-2583 (F)
600
Figure 10. Longitudinal Impedance
V
S
Figure 9. Longitudinal Balance
I
I
LONG
LONG
ANSI */ IEEE STANDARD 455-1985
368
368
Figure 11. ac Gains
LONGITUDINAL BALANCE = 20 log
V
+
–
T/R
100 F
V
V
100 F
+
+
–
–
PR
PT
PT
PR
Z
G
G
LONG
TEST CIRCUIT
V
PT
PR
RCV
XMT
+
–
M
=
BASIC
=
=
TEST CIRCUIT
PT
PR
V
VITR
V
V
I
LONG
V
RCV
T/R
T/R
BASIC
TEST CIRCUIT
PT
VITR
OR
RCV
BASIC
I
LONG
V
PR
V
VITR
RCV
S
12-2587.g (F)
12-2584 (F)
12-2585 (F)
V
V
S
M
31
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