LUCL9310AP-D AGERE [Agere Systems], LUCL9310AP-D Datasheet - Page 14

• Manufacturer Part Number: LUCL9310AP-D
• Description: Line Interface and Line Access Circuit Full-Feature SLIC,Ringing Relay,and Test Access Device
• Manufacturer: AGERE [Agere Systems]

Full-Feature SLIC, Ringing Relay, and Test Access Device
Operating States
Input State Coding
State control is via a tiered logic system. The device
must initially be set to a primary control state (B3 = 0).
This will set the operational state of the SLIC and
switch. The secondary control table (B3 = 1) is used to
turn on the PPM amplifier or to turn on the test circuitry
and enter a test state. The primary state of the device
(the state of the SLIC and switch) will not change when
entering a secondary control state.
Within the primary control table, each state will set the
SLIC and the switch to a specific mode. The exception
is the tip-amp and ring-amp states. The tip-amp and
ring-amp states will change the configuration of the
switches, but leave the state of the SLIC unchanged
from the previous primary control mode.
Once a primary (device) control state is selected, the
PPM or test circuitry can be activated via a secondary
control state. Within the secondary control table, there
are PPM active modes and test active modes. Upon
entering a test active mode in the secondary control
table, both TESTLEV output and TESTSIG input are
active and the test switches set to the appropriate con-
dition. (See Test Architecture Diagram, Figure 2.) An
exception is the V
14
REF
test active mode. Upon entering
V
nal (2.35 V typical) reference voltage appears at
TESTLEV. In the V
deactivated.
Once PPM is on, the user may reverse the battery in
the primary state table without turning off PPM. With
PPM, if the user goes to the scan, ring, or disconnect
mode in the primary table, PPM will be turned off.
Unlike PPM, the test feature, once on, will remain on if
the user transitions to forward active, reverse active,
scan, ring, or disconnect state in the primary state
table.
PPM or test is deactivated by selecting PPM/test off in
the secondary control table.
Data control is via a parallel latched data control
scheme. Data latches are edge-level sensitive. Data is
latched in when the LATCH control input goes low.
Data must be set up 200 ns before LATCH goes low
and held 50 ns after LATCH goes high. While LATCH is
low, the user should not change the data control inputs
at B0, B1, B2, and B3. The data control inputs at B0,
B1, B2, and B3 may only be changed when LATCH is
high. NSTAT supervision output is not controlled by the
LATCH control input.
REF
, only the TESTLEV output is active, and the inter-
REF
mode, the TESTSIG input is
Agere Systems Inc.
July 2001