PCF2127AT/1 NXP [NXP Semiconductors], PCF2127AT/1 Datasheet - Page 75
PCF2127AT/1
Manufacturer Part Number
PCF2127AT/1
Description
Integrated RTC, TCXO and quartz crystal
Manufacturer
NXP [NXP Semiconductors]
Datasheet
1.PCF2127AT1.pdf
(80 pages)
- Current page: 75 of 80
- Download datasheet (536Kb)
NXP Semiconductors
18. References
PCF2127A_2
Product data sheet
[1]
[2]
[3]
[4]
[5]
[6]
[7]
[8]
[9]
[10] JESD78 — IC Latch-Up Test
[11] JESD625-A — Requirements for Handling Electrostatic-Discharge-Sensitive
[12] NX3-00092 — NXP store and transport requirements
[13] UM10204 — I
AN10365 — Surface mount reflow soldering description
AN10853 — Handling precautions of ESD sensitive devices
AN10857 — Application and soldering information for PCF2127A and PCF2129A
TCXO RTC
IEC 60134 — Rating systems for electronic tubes and valves and analogous
semiconductor devices
IEC 61340-5 — Protection of electronic devices from electrostatic phenomena
IPC/JEDEC J-STD-020D — Moisture/Reflow Sensitivity Classification for
Nonhermetic Solid State Surface Mount Devices
JESD22-A114 — Electrostatic Discharge (ESD) Sensitivity Testing Human Body
Model (HBM)
JESD22-A115 — Electrostatic Discharge (ESD) Sensitivity Testing Machine Model
(MM)
JESD22-C101 — Field-Induced Charged-Device Model Test Method for
Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components
(ESDS) Devices
All information provided in this document is subject to legal disclaimers.
2
C-bus specification and user manual
Rev. 02 — 7 May 2010
Integrated RTC, TCXO and quartz crystal
PCF2127A
© NXP B.V. 2010. All rights reserved.
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