PCF2127AT/1 NXP [NXP Semiconductors], PCF2127AT/1 Datasheet - Page 50
PCF2127AT/1
Manufacturer Part Number
PCF2127AT/1
Description
Integrated RTC, TCXO and quartz crystal
Manufacturer
NXP [NXP Semiconductors]
Datasheet
1.PCF2127AT1.pdf
(80 pages)
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NXP Semiconductors
PCF2127A_2
Product data sheet
8.13.6 Timestamp interrupts
8.13.7 Battery switch-over interrupts
8.13.8 Battery low detection interrupts
Interrupt generation from the timestamp function is controlled using the TSIE bit (register
Control_2). If TSIE is enabled the INT pin follows the status of the flags TSFx. Clearing
the flags TSFx immediately clears INT. No pulse generation is possible for timestamp
interrupts.
Generation of interrupts from the battery switch-over is controlled via the BIE bit (register
Control_3). If BIE is enabled, the INT pin follows the status of bit BF in register Control_3
(see
battery switch-over interrupts.
Generation of interrupts from the battery low detection is controlled via the BLIE bit
(register Control_3). If BLIE is enabled the INT pin will follow the status of bit BLF (register
Control_3). The interrupt is cleared when the battery is replaced (BLF is logic 0) or when
bit BLIE is disabled (BLIE is logic 0). BLF is read only and therefore cannot be cleared via
the interface.
Table
52). Clearing BF immediately clears INT. No pulse generation is possible for
All information provided in this document is subject to legal disclaimers.
Rev. 02 — 7 May 2010
Integrated RTC, TCXO and quartz crystal
PCF2127A
© NXP B.V. 2010. All rights reserved.
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