tn28f010-90 Intel Corporation, tn28f010-90 Datasheet - Page 20

• Manufacturer Part Number: tn28f010-90
• Description: 1024k 128k X 8 Cmos Flash Memory
• Manufacturer: Intel Corporation

28F010
AC TESTING INPUT OUTPUT
WAVEFORM
AC TESTING LOAD CIRCUIT
AC TEST CONDITIONS
Input Rise and Fall Times (10% to 90%)
Input Pulse Levels
Input Timing Reference Level
Output Timing Reference Level
Capacitive Load
NOTES
1 Testing characteristics for 28F010-65 in standard configuration and 28F010-90 28F010-120 and 28F010-150
2 Testing characteristics for 28F010-65 in high speed configuration
20
AC test inputs are driven at V
‘‘1’’ and V
begins at V
ing ends at V
to 90%)
C
C
R
L
L
L
e
includes Jig Capacitance
e
100 pF
3 3 KX
k
OL
10 ns
IH
(1)
IH
(2 0 V
(0 45 V
and V
TTL
TTL
IL
) and V
) for a Logic ‘‘0’’ Input timing
Input rise and fall times (10%
(1)
OH
IL
(0 8 V
(1)
(2 4 V
TTL
TTL
0 45V and 2 4V
0 8V and 2 0V
0 8V and 2 0V
) Output tim-
) for a Logic
290207 – 22
290207 – 7
100 pF
10 ns
HIGH SPEED AC TESTING INPUT OUTPUT
WAVEFORM
HIGH SPEED AC TESTING LOAD CIRCUIT
HIGH-SPEED AC TEST CONDITIONS
Input Rise and Fall Times (10% to 90%)
Input Pulse Levels
Input Timing Reference Level
Output Timing Reference Level
Capacitive Load
AC test inputs are driven at 3 0V for a Logic ‘‘1’’ and
0 0V for a Logic ‘‘0’’ Input timing begins and output
timing ends at 1 5V Input rise and fall times (10% to
90%)
C
C
R
L
L
L
includes Jig Capacitance
e
e
k
10 ns
30 pF
3 3 KX
(2)
0 0V and 3 0V
(2)
290207 – 23
290207 – 8
(2)
30 pF
10 ns
1 5V
1 5V