MT55L256L32P Micron Semiconductor Products, Inc., MT55L256L32P Datasheet - Page 19

• Manufacturer Part Number: MT55L256L32P
• Description: 8Mb: 512K X 18, 256K X 32/36 Pipelined ZBT SRAM
• Manufacturer: Micron Semiconductor Products, Inc.

3.3V I/O AC TEST CONDITIONS
LOAD DERATING CURVES
SRAM timing is dependent upon the capacitive loading
on the outputs.
voltage curves.
8Mb: 512K x 18, 256K x 32/36 Pipelined ZBT SRAM
MT55L512L18P_C.p65 – Rev. 2/02
Input pulse levels ................................... V
Input rise and fall times ..................................... 1ns
Input timing reference levels .......................... 1.5V
Output reference levels ................................... 1.5V
Output load ............................. See Figures 1 and 2
The Micron 512K x 18, 256K x 32, and 256K x 36 ZBT
Consult the factory for copies of I/O current versus
3.3V I/O Output Load Equivalents
Q
Q
351
Z = 50
O
Figure 1
Figure 2
+3.3V
V = 1.5V
T
317
5pF
50
SS
to 3.3V
19
2.5V I/O AC TEST CONDITIONS
Input pulse levels ................................... V
Input rise and fall times ..................................... 1ns
Input timing reference levels ........................ 1.25V
Output reference levels ................................. 1.25V
Output load ............................. See Figures 3 and 4
2.5V I/O Output Load Equivalents
8Mb: 512K x 18, 256K x 32/36
Micron Technology, Inc., reserves the right to change products or specifications without notice.
Q
Q
225
PIPELINED ZBT SRAM
Z = 50
O
Figure 3
Figure 4
+2.5V
V = 1.25V
T
225
5pF
50
©2002, Micron Technology, Inc.
SS
to 2.5V