AT32UC3A1256AU Atmel Corporation, AT32UC3A1256AU Datasheet - Page 741

• Manufacturer Part Number: AT32UC3A1256AU
• Manufacturer: Atmel Corporation

Specifications of AT32UC3A1256AU

• Flash (kbytes): 256 Kbytes
• Pin Count: 100
• Max. Operating Frequency: 66 MHz
• Cpu: 32-bit AVR
• # Of Touch Channels: 32
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 69
• Ext Interrupts: 69
• Usb Transceiver: 1
• Usb Speed: Full Speed
• Usb Interface: Device + OTG
• Spi: 6
• Twi (i2c): 1
• Uart: 4
• Ssc: 1
• Ethernet: 1
• Graphic Lcd: No
• Video Decoder: No
• Camera Interface: No
• Adc Channels: 8
• Adc Resolution (bits): 10
• Adc Speed (ksps): 384
• Resistive Touch Screen: No
• Dac Channels: 2
• Dac Resolution (bits): 16
• Temp. Sensor: No
• Crypto Engine: No
• Sram (kbytes): 64
• Self Program Memory: YES
• Dram Memory: No
• Nand Interface: No
• Picopower: No
• Temp. Range (deg C): -40 to 85
• I/o Supply Class: 3.0-3.6 or (1.65-1.95+3.0-3.6)
• Operating Voltage (vcc): 3.0-3.6 or (1.65-1.95+3.0-3.6)
• Fpu: No
• Mpu / Mmu: Yes / No
• Timers: 10
• Output Compare Channels: 16
• Input Capture Channels: 6
• Pwm Channels: 13
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: Yes

32058K AVR32-01/12
36. JTAG and Boundary Scan
36.1
36.2
Features
Overview
Rev.: 2.0.0.2
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•
•
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Figure 36-1 on page 742
troller is a state machine controlled by the TCK and TMS signals. The TAP Controller selects
either the JTAG Instruction Register or one of several Data Registers as the scan chain (shift
register) between the TDI-input and TDO-output. The Instruction Register holds JTAG instruc-
tions controlling the behavior of a Data Register.
The ID Register, Bypass Register, and the Boundary-Scan Chain are the Data Registers used
for board-level testing. The Reset Register can be used to keep the device reset during test or
programming.
The Service Access Bus (SAB) interface contains address and data registers for the Service
Access Bus, which gives access to on-chip debug, programming, and other functions in the
device. The SAB offers several modes of access to the address and data registers, as dis-
cussed in
Section 36.7
document.
IEEE1149.1 compliant JTAG Interface
Boundary-Scan Chain for board-level testing
Direct memory access and programming capabilities through JTAG interface
On-Chip Debug access in compliance with IEEE-ISTO 5001-2003 (Nexus 2.0)
Section
lists the supported JTAG instructions, with references to the description in this
36.6.4.
shows how the JTAG is connected in an AVR32 device. The TAP Con-
AT32UC3A
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