DS3154+ Maxim Integrated Products, DS3154+ Datasheet - Page 36

IC LIU DS3/E3/STS1 QUAD 144CSBGA

DS3154+

Manufacturer Part Number
DS3154+
Description
IC LIU DS3/E3/STS1 QUAD 144CSBGA
Manufacturer
Maxim Integrated Products
Type
Line Interface Units (LIUs)r
Datasheet

Specifications of DS3154+

Number Of Drivers/receivers
4/4
Protocol
IEEE 1149.1
Voltage - Supply
3.135 V ~ 3.465 V
Mounting Type
Surface Mount
Package / Case
144-CSBGA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
DS3151/DS3152/DS3153/DS3154 Single/Dual/Triple/Quad DS3/E3/STS-1 LIUs
12.4
JTAG Test Registers
IEEE 1149.1 requires a minimum of two test registers—the bypass register and the boundary scan register. An
optional test register, the identification register, has been included in the device design. It is used with the IDCODE
instruction and the Test-Logic-Reset state of the TAP controller.
Bypass Register. This single 1-bit shift register, used with the BYPASS, CLAMP, and HIGHZ instructions,
provides a short path between JTDI and JTDO.
Boundary Scan Register. This register contains a shift register path and a latched parallel output for control cells
and digital I/O cells. DS315x BSDL files are available at www.maxim-ic.com/TechSupport/telecom/bsdl.htm.
Identification Register. This register contains a 32-bit shift register and a 32-bit latched parallel output. It is
selected during the IDCODE instruction and when the TAP controller is in the Test-Logic-Reset state.
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