ADDS-BF533-EZLITE Analog Devices Inc, ADDS-BF533-EZLITE Datasheet - Page 45

ADDS-BF533-EZLITE

Manufacturer Part Number
ADDS-BF533-EZLITE
Description
Manufacturer
Analog Devices Inc
Datasheet

Specifications of ADDS-BF533-EZLITE

Significant Other Parts
ADV7183 Video Decode
Lead Free Status / Rohs Status
Not Compliant
POWER DISSIPATION
Many operating conditions can affect power dissipation. System
designers should refer to Estimating Power for ADSP-BF531/
BF532/BF533 Blackfin Processors (EE-229) on the Analog
Devices website (www.analog.com)—use site search on
“EE-229.” This document provides detailed information for
optimizing your design for lowest power.
See the ADSP-BF533 Blackfin Processor Hardware Reference
Manual for definitions of the various operating modes and for
instructions on how to minimize system power.
TEST CONDITIONS
All timing parameters appearing in this data sheet were mea­
sured under the conditions described in this section.
shows the measurement point for ac measurements (except out­
put enable/disable). The measurement point V
V
3.3 V.
Output Enable Time Measurement
Output pins are considered to be enabled when they have made
a transition from a high impedance state to the point when they
start driving.
The output enable time t
reference signal reaches a high or low voltage level to the point
when the output starts driving as shown on the right side of
Figure
The time t
nal switches, to when the output voltage reaches V
V
and V
DDEXT
TRIP
–100
–150
150
100
–50
50
0
(low). For V
0
(nominal) = 1.8 V or 1.5 V for V
TRIP
43.
OUTPUT
INPUT
OR
(low) is 0.7 V. For V
ENA
Measurements (Except Output Enable/Disable)
_
0.5
MEASURED
Figure 42. Voltage Reference Levels for AC
Figure 41. Drive Current D (V
V
MEAS
DDEXT
is the interval, from when the reference sig-
1.0
SOURCE VOLTAGE (V)
(nominal) = 1.8 V—V
ENA
is the interval from the point when a
1.5
DDEXT
(nominal) = 2.5 V/3.3 V—
2.0
DDEXT
DDEXT
= 3.3 V)
(nominal) = 2.5 V/
2.5
TRIP
MEAS
(high) is 1.3 V
is 0.95 V for
V
V
V
TRIP
DDEXT
DDEXT
DDEXT
V
Rev. E | Page 45 of 60 | July 2007
MEAS
3.0
Figure 42
(high) or
= 3.65V
= 3.30V
= 2.95V
V
V
OH
OL
3.5
ADSP-BF531/ADSP-BF532/ADSP-BF533
V
interval from when the output starts driving to when the output
reaches the V
Time t
If multiple pins (such as the data bus) are enabled, the measure­
ment value is that of the first pin to start driving.
Output Disable Time Measurement
Output pins are considered to be disabled when they stop driv­
ing, go into a high impedance state, and start to decay from their
output high or low voltage. The output disable time t
difference between t
side of
The time for the voltage on the bus to decay by
on the capacitive load C
can be approximated by the equation:
The time t
Δ
V
The time t
signal switches, to when the output voltage decays
measured output high or output low voltage.
Example System Hold Time Calculation
To determine the data output hold time in a particular system,
first calculate t
to be the difference between the ADSP-BF531/ADSP-BF532/
ADSP-BF533 processor’s output voltage and the input thresh-
old for the device requiring the hold time. C
capacitance (per data line), and I
three-state current (per data line). The hold time will be t
V equal to 0.1 V for V
TRIP
DDEXT
(MEASURED)
(MEASURED)
t
DIS
V
V
(high) is 2.0 V and V
OH
OL
ENA
Figure
OUTPUT STOPS DRIVING
(nominal) = 2.5 V/3.3 V.
is calculated as shown in the equation:
DECAY
DIS_MEASURED
TRIP
42.
DECAY
t
is calculated with test loads C
DIS
REFERENCE
t
V
(high) or V
V
Figure 43. Output Enable/Disable
t
DIS_MEASURED
OH
OL
ENA
SIGNAL
t
using the equation given above. Choose
DIS_MEASURED
= t
(MEASURED) � �V
(MEASURED) + �V
DECAY
t
DECAY
is the interval from when the reference
=
L
DDEXT
DIS_MEASURED
and the load current I
HIGH IMPEDANCE STATE
t
TRIP
ENA_MEASURED
= (C
TRIP
(nominal) = 1.8 V or 0.5 V for
t
(low) is 1.0 V . Time t
ENA
and t
(low) trip voltage.
L
L
is the total leakage or
ΔV) ⁄ I
– t
OUTPUT STARTS DRIVING
DECAY
DECAY
t
L
t
TRIP
as shown on the left
ENA_MEASURED
V
V
TRIP
TRIP
L
t
is the total bus
TRIP
L
I
(LOW)
and I
(HIGH)
. This decay time
V
V
Δ
OH
OL
V is dependent
(MEASURED)
(MEASURED)
Δ
L
V from the
TRIP
, and with
DIS
is the
is the
DECAY
Δ
V