SCANSTA111SM National Semiconductor, SCANSTA111SM Datasheet - Page 5

• Manufacturer Part Number: SCANSTA111SM
• Manufacturer: National Semiconductor

Specifications of SCANSTA111SM

• Operating Temperature (min): -40C
• Operating Temperature Classification: Industrial
• Operating Temperature (max): 85C
• Package Type: FBGA
• Rad Hardened: No
• Lead Free Status / RoHS Status: Not Compliant

A
Y
LSP_ACTIVE
TRIST
TEST ENABLE
(0-1)
(0-1)
Note 1: Refer to the IBIS model on our website for I/O characteristics.
Application Overview
ADDRESSING SCHEME - The SCANSTA111 architecture
extends the functionality of the IEEE 1149.1 Standard by sup-
plementing that protocol with an addressing scheme which
allows a test controller to communicate with specific
'STA111s within a network of 'STA111s. That network can
include both multi-drop and hierarchical connectivity. In ef-
fect, the 'STA111 architecture allows a test controller to dy-
namically select specific portions of such a network for
participation in scan operations. This allows a complex sys-
tem to be partitioned into smaller blocks for testing purposes.
The 'STA111 provides two levels of test-network partitioning
capability. First, a test controller can select individual
'STA111s, specific sets of 'STA111s (multi-cast groups), or all
'STA111s (broadcast). This 'STA111-selection process is
supported by a Level-1 communication protocol. Second,
within each selected 'STA111, a test controller can select one
or more of the chip's three local scan-ports. That is, individual
local ports can be selected for inclusion in the (single) scan-
chain which a 'STA111 presents to the test controller. This
mechanism allows a controller to select specific terminal
scan-chains within the overall scan network. The port-selec-
tion process is supported by a Level-2 protocol.
HIERARCHICAL SUPPORT - Multiple SCANSTA111's can
be used to assemble a hierarchical boundary-scan tree. In
such a configuration, the system tester can configure the local
ports of a set of 'STA111s so as to connect a specific set of
local scan-chains to the active scan chain. Using this capa-
bility, the tester can selectively communicate with specific
Pin Name
(0-2)
(0-2)
Pins
No.
2
2
3
3
1
I/O
O
O
O
I
I
LOCAL PASS-THROUGH INPUTS: General purpose inputs which can be driven to the backplane
pin Y
have an internal pull-up resistor.
LOCAL PASS-THROUGH OUTPUT: General purpose outputs which can be driven from the
backplane pin A
outputs have 24mA of drive current.
LOCAL ANALOG TEST BUS ENABLE: These analog pins serve as enable signals for analog
busses supporting the IEEE 1149.4 Mixed-Signal Test Bus standard , or for backplane physical
layer changes (i.e.; TTL to LVDS). These outputs have 12mA of drive current.
LOCAL TRI-STATE NOTIFICATION OUTPUTS: This signal is high when the local scan ports are
TRI-STATEd . These pins are used for backplane physical layer changes (i.e.; TTL to LVDS).
These outputs have 12mA of drive current.
TEST ENABLE INPUT: This pin is used for factory test and should be tied to V
operation.
B
. (Only on LSP
B
. (Only on LSP
0
and LSP
5
0
1
. Only available when a single LSP is selected) . These inputs
and LSP
portions of a target system. The tester's scan port is connect-
ed to the backplane scan port of a root layer of 'STA111s,
each of which can be selected using multi-drop addressing.
A second tier of 'STA111s can be connected to this root layer,
by connecting a local port (LSP) of a root-layer 'STA111 to
the backplane port of a second-tier 'STA111. This process
can be continued to construct a multi-level scan hierarchy.
'STA111 local ports which are not cascaded into higher-level
'STA111s can be thought of as the terminal leaves of a scan
tree. The test master can select one or more target leaves by
selecting and configuring the local ports of an appropriate set
of 'STA111s in the test tree.
Check with your ATPG tool vendor to ensure support of this
feature.
State Machines
The 'STA111 is IEEE 1149.1-compatible, in that it supports
all required 1149.1 operations. In addition, it supports a higher
level of protocol, (Level 1), that extends the IEEE 1149.1 Std.
to a multi-drop environment.
In multi-drop scan systems, a scan tester can select individual
'STA111s for participation in upcoming scan operations.
STA111 selection is accomplished by simultaneously scan-
ning a device address out to multiple 'STA111s. Through an
on-chip address matching process, only those 'STA111s
whose statically-assigned address matches the scanned-out
address become selected to receive further instructions from
the scan tester. SCANSTA111 selection is done using a Lev-
el-1 protocol, while follow-on instructions are sent to selected
'STA111s by using a Level-2 protocol.
1
Description
. Only available when a single LSP is selected) . These
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