SCANSTA111SM National Semiconductor, SCANSTA111SM Datasheet - Page 4

• Manufacturer Part Number: SCANSTA111SM
• Manufacturer: National Semiconductor

Specifications of SCANSTA111SM

• Operating Temperature (min): -40C
• Operating Temperature Classification: Industrial
• Operating Temperature (max): 85C
• Package Type: FBGA
• Rad Hardened: No
• Lead Free Status / RoHS Status: Not Compliant

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VCC
GND
TMS
TDI
TDO
TCK
TRST
TRIST
A
Y
S
OE
TDO
TDI
TMS
TCK
TRST
B
(0-6)
B
B
(0-2)
B
(0-2)
Pin Name
B
B
(0-2)
(0-2)
B
(0-2)
(B,0-2)
Pins
No.
3
3
1
1
1
1
1
4
1
1
7
1
3
3
3
3
3
N/A
N/A
I/O
O
O
O
O
O
O
O
I
I
I
I
I
I
I
I
Power
Ground
BACKPLANE TEST MODE SELECT: Controls sequencing through the TAP Controller of the
'STA111. Also controls sequencing of the TAPs which are on the local scan chains. This input
has a 25KΩ pull-up resistor and no ESD clamp diode (ESD is controlled with an alternate method).
When the device is power-off (V
(Note
load with the pull-up to ground.
BACKPLANE TEST DATA INPUT: All backplane scan data is supplied to the 'STA111 through
this input pin. This input has a 25KΩ pull-up resistor and no ESD clamp diode (ESD is controlled
with an alternate method). When the device is power-off (V
a capacitive load to ground
appears to be a capacitive load with the pull-up to ground.
BACKPLANE TEST DATA OUTPUT: This output drives test data from the 'STA111 and the local
TAPs, back toward the scan master controller. This output has 24mA of drive current. When the
device is power-off (V
TEST CLOCK INPUT FROM THE BACKPLANE: This is the master clock signal that controls all
scan operations of the 'STA111 and of the local scan ports. This input has no pull-up resistor and
no ESD clamp diode (ESD is controlled with an alternate method). When the device is power-off
(V
not floating but tied to V
TEST RESET: An asynchronous reset signal (active low) which initializes the 'STA111 logic. This
input has a 25KΩ pull-up resistor and no ESD clamp diode (ESD is controlled with an alternate
method). When the device is power-off (V
to ground
capacitive load with the pull-up to ground.
TRI-STATE NOTIFICATION OUTPUT: This signal is asserted high when the associated TDO is
TRI-STATEd. Associated means TRIST
12mA of drive current.
BACKPLANE PASS-THROUGH INPUT: A general purpose input which is driven to the Y
single selected LSP. (Not available when multiple LSPs are selected). This input has an internal
pull-up resistor.
BACKPLANE PASS-THROUGH OUTPUT: A general purpose output which is driven from the
A
24mA of drive current.
SLOT IDENTIFICATION: The configuration of these pins is used to identify (assign a unique
address to) each 'STA111 on the system backplane .
OUTPUT ENABLE for the Local Scan Ports, active low. When high, this active-low control signal
TRI-STATEs all local scan ports on the 'STA111, to enable an alternate resource to access one
or more of the three local scan chains.
TEST DATA OUTPUTS: Individual output for each of the local scan ports . These outputs have
24mA of drive current.
TEST DATA INPUTS: Individual scan data input for each of the local scan ports .
TEST MODE SELECT OUTPUTS: Individual output for each of the local scan ports. TMS
not provide a pull-up resistor (which is assumed to be present on a connected TMS input, per the
IEEE 1149.1 requirement) . These outputs have 24mA of drive current.
LOCAL TEST CLOCK OUTPUTS: Individual output for each of the local scan ports. These are
buffered versions of TCK
LOCAL TEST RESETS: A gated version of TRST
n
DD
of a single selected LSP. (Not available when multiple LSPs are selected). This output has
floating), this input appears to be a capacitive load to ground
1). When V
(Note
TABLE 2. Pin Descriptions
1). When V
DD
= 0V (i.e.; not floating but tied to V
DD
SS
= 0V or floating), this output appears to be a capacitive load
B
) this input appears to be a capacitive load to ground.
. These outputs have 24mA of drive current.
(Note
DD
4
= 0V (i.e.; not floating but tied to V
DD
1). When V
floating), this input appears to be a capacitive load to ground
B
Description
DD
is for TDO
floating), this input appears to be a capacitive load
DD
= 0V (i.e.; not floating but tied to V
B
. These outputs have 24mA of drive current.
B
, TRIST
SS
) this input appears to be a capacitive
DD
1
floating), this input appears to be
is for TDO
SS
(Note
) this input appears to be a
1). When V
1
, etc. This output has
SS
DD
) this input
(Note
= 0V (i.e.;
n
n
does
of a
1).