CYIH1SM1000AA-HHCS Cypress Semiconductor Corp, CYIH1SM1000AA-HHCS Datasheet - Page 5

• Manufacturer Part Number: CYIH1SM1000AA-HHCS
• Description: IC SPACE IMAGE SENSOR 84-JLCC
• Manufacturer: Cypress Semiconductor Corp

Specifications of CYIH1SM1000AA-HHCS

• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant

5.7 Environmental and Endurance Tests
5.7.1 Electrical and Electro-optical Measurements on
The parameters to be measured on completion of environmental
tests are scheduled in
stated, the measurements shall be performed at a environmental
temperature of 22±3°C. Measurements of dark current must be
performed at 22±1°C and the actual environmental temperature
must be reported with the test results.
5.7.2 Electrical and Electro-optical Measurements At
The parameters to be measured at intermediate points during
endurance test of environmental tests are scheduled in
on page 21. Unless otherwise stated, the measurements shall
be performed at an environmental temperature of 22±3°C
5.7.3 Electrical and electro-optical measurements on Completion
The parameters to be measured on completion of endurance
tests are scheduled in
stated, the measurements shall be performed at a environmental
temperature of 22±3°C
5.7.4 Conditions for Operating Life Test
The conditions for operating life tests shall be as specified in
Table 10
5.7.5 Electrical Circuits for Operating Life Test
Circuits for performing the operating life test are shown in
48
5.7.6 Conditions for High Temperature Storage Test
The temperature to be applied shall be the maximum storage
temperature specified in
Before and after total dose test and endurance test:
■
■
■
Document Number: 001-54123 Rev. *A
Wafer processing data review
SEM
Total dose test
Endurance test
Electrical measurements before and after at high, low and room
temperature. Conform
15,Table 6
Visual inspection before and after
Detailed electro optical measurements before and after
on page 63 and next ones of this specification.
of Endurance Test
Completion of Environmental Test
Intermediate Point During Endurance Test
on page 21 of this specification.
on page 16 of this specification.
Test
Table 11
Table 11
Table 4
Table 2
on page 14 and
on page 9 of this specification.
on page 21. Unless otherwise
on page 21. Unless otherwise
PID
ESCC 21400
ESCC 22900
MIL-STD-883
Method 1005
Test method
Table 5
NA
4 naked dies
3 devices
6 devices
Number of devices
on page
Table 11
Figure
5.8 Total Dose Radiation Test
5.8.1 Application
The total dose radiation test shall be performed in accordance
with the requirements of ESCC Basic specification 22900.
5.8.2 Parameter Drift Values
The allowable parameter drift values after total dose irradiation
are listed in
after a total dose of 42KRad and 168h/100°C annealing.
5.8.3 Bias conditions
Continuous bias shall be applied during irradiation testing as
shown in
cation.
5.8.4 Electrical and Electro-optical Measurements
The parameters to be measured, prior to, during and on
completion of the irradiation are listed in
this specification. Only devices that meet the specification in
Table 4
test samples.
5.9 Lot Acceptance and Screening
This paragraph describes the Lot Acceptance Testing (LAT) and
screening on the HAS FM devices. All tests on device level have
to be performed on screened devices (see
7).
5.9.1 Wafer Lot Acceptance
This is the acceptance of the silicon wafer lot. This has to be
done on every wafer lot that will be used for the assembly of flight
models.
5.9.2 Glass Lot Acceptance
Transmission and reflectance curves that are delievered with
each lot shall be compared with the specifications in
“Glass Lid Specification,”
3 glass lid shall be chosen randomly from the lot and will be
measured in detail. All obtained results will be compared with
Figure 5
on page 14 of this specification shall be included in the
on page 27.
Figure 48
NA
NA
42 krad : 1krad/h
2000h at +125 C
Table 8
Test condition
on page 19. The parameters shown are valid
on page 63 and next ones of this specifi-
CYIH1SM1000AA-HHCS
on page 10
CY
Test house
ESTEC by CY
Test House
Test location
Table 13
Table 5.9.6
on page 24 of
Page 5 of 71
on page
Table ,
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