CYIH1SM1000AA-HHCS Cypress Semiconductor Corp, CYIH1SM1000AA-HHCS Datasheet - Page 4

• Manufacturer Part Number: CYIH1SM1000AA-HHCS
• Description: IC SPACE IMAGE SENSOR 84-JLCC
• Manufacturer: Cypress Semiconductor Corp

Specifications of CYIH1SM1000AA-HHCS

• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant

5.4 Marking
5.4.1 General
The marking Shall consist of a lead identification and traceability information.
5.4.2 Lead Identification
An index to pin 1 shall be located on the top of the package in the position defined in
counter clock-wise, when looking at the top-side of the component.
5.4.3 Traceability Information
Each component shall be marked such that complete traceability can be maintained.
The component shall bear a number that is constituted as follows:
5.5 Electrical and Electro-optical Measurements
5.5.1 Electrical and Electro-optical Measurements at Reference
The parameters to be measured to verify the electrical and
electro-optical specifications are scheduled in
14 and
measurements shall be performed at a environmental temper-
ature of 22±3°C.
For all measurements the nominal power supply, bias and
clocking conditions apply. The nominal power supply and bias
conditions are given in
in
Remark: The given bias and power supply settings imply that the
devices are measured in "soft- reset" condition.
5.5.2 Electrical and Electro-optical measurements at High and
The parameters to be measured to verify the electrical and
electro-optical specifications are scheduled in
15 and
measurements shall be performed at
-40 (-5 +0) °C and at +85 (+5 -0) °C.
5.5.3 Circuits for Electrical and Electro-optical Measurements
Circuits for performing the electro-optical tests in
14 and
to
Document Number: 001-54123 Rev. *A
Figure 35
Figure 51
Temperature
Low Temperature
Table 13
Table 13
Table 6
on page 51 and
on page 63.
on page 16. Unless otherwise specified, the
on page 24 are shown in
on page 24. Unless otherwise specified, the
Table 14
Indication of type. To be replaced
by detail specification number
when this is allocated.
Type variant
Serial number
Production date (YYMMDD)
Figure 37
on page 24, the timing diagrams
on page 53.
Figure 48
Table 4
Table 5
Table 4
on page 63
on page
on page
on page
5.6 Burn-in Test
5.6.1 Parameter Drift Values
The parameter drift values for power burn-in are specified in
Table 7
specified the measurements shall be conducted at a environ-
mental temperature of 22±3°C and under nominal power supply,
bias and timing conditions.
The parameter drift values shall not be exceeded. In addition to
these drift value requirements, also the limit values of any
parameter - as indicated in
exceeded.
Conditions for high temperature reverse bias burn-in
Not Applicable
5.6.2 Conditions for Power Burn-in
The conditions for power burn-in shall be as specified in
10
5.6.3 Electrical Circuits for High Temperature Reverse Bias
Not Applicable
5.6.4 Electrical Circuits for Power Burn-in
Circuits to perform the power burn-in test are shown in
on page 63 and next ones of this specification.
on page 21 of this specification
Burn-in
on page 18 of this specification. Unless otherwise
HAS2 - FM
000001
061006
Figure 2
CYIH1SM1000AA-HHCS
on page 25. The pin numbering is
Table 4
on page 14 - shall not be
Page 4 of 71
Figure 48
Table
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