MC9S08DZ128CLF Freescale Semiconductor, MC9S08DZ128CLF Datasheet - Page 446
![no-image](/images/manufacturer_photos/0/2/262/freescale_semiconductor_sml.jpg)
MC9S08DZ128CLF
Manufacturer Part Number
MC9S08DZ128CLF
Description
MCU 8BIT 128K FLASH 48-LQFP
Manufacturer
Freescale Semiconductor
Series
HCS08r
Datasheets
1.MC9S08DV96CLF.pdf
(458 pages)
2.MC9S08DV96CLF.pdf
(4 pages)
3.MC9S08DZ128CLF.pdf
(4 pages)
4.MC9S08DZ96MLL.pdf
(4 pages)
Specifications of MC9S08DZ128CLF
Core Processor
HCS08
Core Size
8-Bit
Speed
40MHz
Connectivity
CAN, I²C, LIN, SCI, SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
39
Program Memory Size
128KB (128K x 8)
Program Memory Type
FLASH
Eeprom Size
2K x 8
Ram Size
8K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Data Converters
A/D 16x12b
Oscillator Type
External
Operating Temperature
-40°C ~ 85°C
Package / Case
48-LQFP
Package
48LQFP
Family Name
HCS08
Maximum Speed
40 MHz
Operating Supply Voltage
3.3|5 V
Data Bus Width
8 Bit
Number Of Programmable I/os
87
Interface Type
CAN/I2C/SPI/UART
On-chip Adc
24-chx12-bit
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
MC9S08DZ128CLF
Manufacturer:
Freescale Semiconductor
Quantity:
10 000
- MC9S08DV96CLF PDF datasheet
- MC9S08DV96CLF PDF datasheet #2
- MC9S08DZ128CLF PDF datasheet #3
- MC9S08DZ96MLL PDF datasheet #4
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- Download datasheet (5Mb)
Appendix A Electrical Characteristics
A.14 EMC Performance
Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the
MCU resides. Board design and layout, circuit topology choices, location and characteristics of external
components as well as MCU software operation all play a significant role in EMC performance. The
system designer should consult Freescale applications notes such as AN2321, AN1050, AN1263,
AN2764, and AN1259 for advice and guidance specifically targeted at optimizing EMC performance.
A.14.1
Microcontroller radiated RF emissions are measured from 150 kHz to 1 GHz using the TEM/GTEM Cell
method in accordance with the IEC 61967-2 and SAE J1752/3 standards. The measurement is performed
with the microcontroller installed on a custom EMC evaluation board while running specialized EMC test
software. The radiated emissions from the microcontroller are measured in a TEM cell in two package
orientations (North and East). For more detailed information concerning the evaluation results, conditions
and setup, please refer to the EMC Evaluation Report for this device.
The maximum radiated RF emissions of the tested configuration in all orientations are less than or equal
to the reported emissions levels.
446
1
Radiated emissions,
electric field
Data based on qualification test results.
Parameter
Radiated Emissions
V
Symbol
RE_TEM
MC9S08DZ128 Series Data Sheet, Rev. 1
Table A-18. Radiated Emissions
Conditions
T
100 LQFP
V
A
DD
= +25
= 5V
o
C
500 – 1000 MHz
150 – 500 MHz
0.15 – 50 MHz
50 – 150 MHz
Frequency
SAE Level
IEC Level
16 MHz Crystal
20 MHz Bus
f
osc
/f
CPU
Freescale Semiconductor
Level
(Max)
14
21
-5
6
L
3
1
dBμV
Unit
—
—
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