S9S08SG16E1MTJ Freescale Semiconductor, S9S08SG16E1MTJ Datasheet - Page 291

• Manufacturer Part Number: S9S08SG16E1MTJ
• Description: MCU 16K FLASH 20-TSSOP
• Manufacturer: Freescale Semiconductor
• Series: HCS08r

Specifications of S9S08SG16E1MTJ

• Core Processor: HCS08
• Core Size: 8-Bit
• Speed: 40MHz
• Connectivity: I²C, LIN, SCI, SPI
• Peripherals: LVD. POR, PWM, WDT
• Number Of I /o: 16
• Program Memory Size: 16KB (16K x 8)
• Program Memory Type: FLASH
• Ram Size: 1K x 8
• Voltage - Supply (vcc/vdd): 2.7 V ~ 5.5 V
• Data Converters: A/D 12x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 125°C
• Package / Case: 20-TSSOP
• Processor Series: S08SG
• Core: HCS08
• Data Bus Width: 8 bit
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: EWS08
• Development Tools By Supplier: DEMO9S08SG32, DEMO9S08SG32AUTO, DEMO9S08SG8, DEMO9S08SG8AUTO
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Details

Appendix A
Electrical Characteristics
A.1
This section contains electrical and timing specifications for the MC9S08SG32 Series of microcontrollers
available at the time of publication. The MC9S08SG32 Series includes both:
A.2
The electrical parameters shown in this supplement are guaranteed by various methods. To give the
customer a better understanding, the following classification is used and the parameters are tagged
accordingly in the tables where appropriate:
A.3
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not
guaranteed. Stress beyond the limits specified in
permanent damage to the device. For functional operating conditions, refer to the remaining tables in this
section.
Freescale Semiconductor
•
•
Standard (STD)— devices that are standard-temperature rated. Table rows marked with a
indicate electrical characteristics that apply to these devices.
AEC Grade 0 — devices that are high-temperature rated. Table rows marked with a
electrical characteristics that apply to AEC Grade 0 devices.
C
D
P
T
Introduction
Parameter Classification
Absolute Maximum Ratings
Those parameters are guaranteed during production testing on each individual device.
Those parameters are achieved through the design characterization by measuring a statistically relevant
sample size across process variations.
Those parameters are achieved by design characterization on a small sample size from typical devices
under typical conditions unless otherwise noted. All values shown in the typical column are within this
category.
Those parameters are derived mainly from simulations.
The classification is shown in the column labeled “C” in the parameter
tables where appropriate.
Table A-1. Parameter Classifications
MC9S08SG32 Data Sheet, Rev. 8
Table A-2
NOTE
may affect device reliability or cause
♦
indicate
♦
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