PIC18F24J10-I/SP Microchip Technology, PIC18F24J10-I/SP Datasheet - Page 248

IC PIC MCU FLASH 8KX16 28-DIP

PIC18F24J10-I/SP

Manufacturer Part Number
PIC18F24J10-I/SP
Description
IC PIC MCU FLASH 8KX16 28-DIP
Manufacturer
Microchip Technology
Series
PIC® 18Fr

Specifications of PIC18F24J10-I/SP

Program Memory Type
FLASH
Program Memory Size
16KB (8K x 16)
Package / Case
28-DIP (0.300", 7.62mm)
Core Processor
PIC
Core Size
8-Bit
Speed
40MHz
Connectivity
I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
21
Ram Size
1K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 3.6 V
Data Converters
A/D 10x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Processor Series
PIC18F
Core
PIC
Data Bus Width
8 bit
Data Ram Size
1 KB
Interface Type
SPIC/I2C/EUSART
Maximum Clock Frequency
40 MHz
Number Of Programmable I/os
21
Number Of Timers
3
Operating Supply Voltage
2 V to 3.6 V
Maximum Operating Temperature
+ 85 C
Mounting Style
Through Hole
3rd Party Development Tools
52715-96, 52716-328, 52717-734, 52712-325, EWPIC18
Development Tools By Supplier
PG164130, DV164035, DV244005, DV164005, PG164120, DM183032, DV164136
Minimum Operating Temperature
- 40 C
On-chip Adc
10-ch x 10-bit
Package
28SPDIP
Device Core
PIC
Family Name
PIC18
Maximum Speed
40 MHz
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
For Use With
AC162074 - HEADER INTRFC MPLAB ICD2 44TQFPAC162067 - HEADER INTRFC MPLAB ICD2 40/28P
Eeprom Size
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
PIC18F45J10 FAMILY
FIGURE 21-5:
21.5.3
By entering a power-managed mode, the clock
multiplexor selects the clock source selected by the
OSCCON register. Fail-Safe Monitoring of the
power-managed
power-managed mode.
If an oscillator failure occurs during power-managed
operation, the subsequent events depend on whether
or not the oscillator failure interrupt is enabled. If
enabled (OSCFIF = 1), code execution will be clocked
by the INTOSC multiplexor. An automatic transition
back to the failed clock source will not occur.
If the interrupt is disabled, subsequent interrupts while
in Idle mode will cause the CPU to begin executing
instructions while being clocked by the INTOSC
source.
DS39682E-page 246
Note:
Sample Clock
CM Output
FSCM INTERRUPTS IN
POWER-MANAGED MODES
OSCFIF
Device
Output
Clock
The device clock is normally at a much higher frequency than the sample clock. The relative frequencies in
this example have been chosen for clarity.
(Q)
clock
FSCM TIMING DIAGRAM
source
resumes
CM Test
in
the
21.5.4
The FSCM is designed to detect oscillator failure at any
point after the device has exited Power-on Reset
(POR) or low-power Sleep mode. When the primary
device clock is either EC or INTRC modes, monitoring
can begin immediately following these events.
For HS mode, the situation is somewhat different.
Since the oscillator may require a start-up time consid-
erably longer than the FSCM sample clock time, a false
clock failure may be detected. To prevent this, the
internal oscillator block is automatically configured as
the device clock and functions until the primary clock is
stable (the OST timer has timed out). This is identical
to Two-Speed Start-up mode. Once the primary clock is
stable, the INTRC returns to its role as the FSCM
source.
As noted in Section 21.4.1 “Special Considerations
for Using Two-Speed Start-up”, it is also possible to
select another clock configuration and enter an alternate
power-managed mode while waiting for the primary
clock to become stable. When the new power-managed
mode is selected, the primary clock is disabled.
Note:
CM Test
Oscillator
Failure
POR OR WAKE-UP FROM SLEEP
The same logic that prevents false oscilla-
tor failure interrupts on POR, or wake from
Sleep, will also prevent the detection of
the oscillator’s failure to start at all
following these events. This can be
avoided by monitoring the OSTS bit and
using a timing routine to determine if the
oscillator is taking too long to start. Even
so, no oscillator failure interrupt will be
flagged.
© 2009 Microchip Technology Inc.
Detected
Failure
CM Test

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