zl50023 Zarlink Semiconductor, zl50023 Datasheet - Page 36

• Manufacturer Part Number: zl50023
• Description: Enhanced 4 K Channel Tdm Switch With Rate Conversion
• Manufacturer: Zarlink Semiconductor

When the quadrant frame control bits, STIN[n]Q3C2 - 0 (bit 11 - 9), STIN[n]Q2C2 - 0 (bit 8 - 6), STIN[n]Q1C2 - 0 (bit
5 - 3) or STIN[n]Q1C2 - 0 (bit 2 - 0), are set, the LSB or MSB of every input channel in the quadrant is forced to “1”
or “0” as shown by the following table:
Note that Quadrant Frame Programming and BER reception cannot be used simultaneously on the same input
stream.
17.0
The JTAG test port is implemented to meet the mandatory requirements of the IEEE-1149.1 (JTAG) standard. The
operation of the boundary-scan circuitry is controlled by an external Test Access Port (TAP) Controller.
17.1
The Test Access Port (TAP) accesses the ZL50023 test functions. It consists of three input pins and one output pin
as follows:
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•
•
•
•
Test Clock Input (TCK) - TCK provides the clock for the test logic. TCK does not interfere with any on-chip
clock and thus remains independent in the functional mode. TCK permits shifting of test data into or out of
the Boundary-Scan register cells concurrently with the operation of the device and without interfering with
the on-chip logic.
Test Mode Selection Inputs (TMS) - The TAP Controller uses the logic signals received at the TMS input to
control test operations. The TMS signals are sampled at the rising edge of the TCK pulse. This pin is
internally pulled to high when it is not driven from an external source.
Test Data Input (TDi) - Serial input data applied to this port is fed either into the instruction register or into a
test data register, depending on the sequence previously applied to the TMS input. The registers are
described in a subsequent section. The received input data is sampled at the rising edge of the TCK pulse.
This pin is internally pulled to high when it is not driven from an external source.
Test Data Output (TDo) - Depending on the sequence previously applied to the TMS input, the contents of
either the instruction register or test data register are serially shifted out towards TDo. The data from TDo is
clocked on the falling edge of the TCK pulses. When no data is shifted through the boundary scan cells, the
TDo driver is set to a high impedance state.
Test Reset (TRST) - Resets the JTAG scan structure. This pin is internally pulled to high when it is not
driven from an external source.
Test Access Port (TAP)
JTAG Port
Note: y = 0, 1, 2, 3
STIN[n]Q[y]C[2:0]
100
101
0xx
110
111
Table 11 - Quadrant Frame Bit Replacement
Normal Operation
Replaces LSB of every channel in Quadrant y with ‘0’
Replaces LSB of every channel in Quadrant y with ‘1’
Replaces MSB of every channel in Quadrant y with ‘0’
Replaces MSB of every channel in Quadrant y with ‘1’
Zarlink Semiconductor Inc.
ZL50023
36
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