lh28f800bg-l Sharp Microelectronics of the Americas, lh28f800bg-l Datasheet - Page 28

• Manufacturer Part Number: lh28f800bg-l
• Description: M-bit Smartvoltage Flash Memories
• Manufacturer: Sharp Microelectronics of the Americas

6.2.4 AC CHARACTERISTICS - READ-ONLY OPERATIONS (contd.)
NOTES :
1. See AC Input/Output Reference Waveform (Fig. 7
2. OE# may be delayed up to t
3. Sampled, not 100% tested.
4. See Fig. 8 "Transient Input/Output Reference
SYMBOL
• V
t
t
t
t
t
t
t
t
t
t
AVAV
AVQV
ELQV
PHQV
GLQV
ELQX
EHQZ
GLQX
GHQZ
OH
CC
through Fig. 9) for maximum allowable input slew rate.
edge of CE# without impact on t
Waveform" and Fig. 10 "Transient Equivalent Testing
Load Circuit" (High Speed Configuration) for testing
characteristics.
= 5.0±0.25 V, 5.0±0.5 V, T
Read Cycle Time
Address to Output Delay
CE# to Output Delay
RP# High to Output Delay
OE# to Output Delay
CE# to Output in Low Z
CE# High to Output in High Z
OE# to Output in Low Z
OE# High to Output in High Z
Output Hold from Address,
CE# or OE# Change,
Whichever Occurs First
VERSIONS
PARAMETER
ELQV
ELQV
A
-t
= 0 to +70˚C or –40 to +85
GLQV
.
V
V
CC
CC
after the falling
±0.25 V
±0.5 V
NOTE
2
2
3
3
3
3
3
LH28F800BGH-L85
LH28F800BG-L85
(NOTE 4)
MIN.
- 28 -
85
0
0
0
5. See Fig. 9 "Transient Input/Output Reference
MAX.
˚
400
C
85
85
40
55
10
LH28F800BG-L/BGH-L (FOR TSOP, CSP)
Waveform" and Fig. 10 "Transient Equivalent Testing
Load Circuit" (Standard Configuration) for testing
characteristics.
LH28F800BGH-L85
LH28F800BG-L85
(NOTE 5)
MIN.
90
0
0
0
MAX.
400
(NOTE 1)
90
90
45
55
10
LH28F800BGH-L12
(NOTE 5)
LH28F800BG-L12
MIN.
120
0
0
0
MAX.
120
120
400
50
55
15
UNIT
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns