lh28f800bg-l Sharp Microelectronics of the Americas, lh28f800bg-l Datasheet

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lh28f800bg-l

Manufacturer Part Number
lh28f800bg-l
Description
M-bit Smartvoltage Flash Memories
Manufacturer
Sharp Microelectronics of the Americas
Datasheet
DESCRIPTION
The LH28F800BG-L/BGH-L flash memories with
SmartVoltage technology are high-density, low-cost,
nonvolatile, read/write storage solution for a wide
range of applications. The LH28F800BG-L/BGH-L
can operate at V
low voltage operation capability realizes longer
battery life and suits for cellular phone application.
Their
architecture, flexible voltage and enhanced cycling
capability provide for highly flexible component
suitable for portable terminals and personal
computers. Their enhanced suspend capabilities
provide for an ideal solution for code + data storage
applications. For secure code storage applications,
such as networking, where code is either directly
executed out of flash or downloaded to DRAM, the
LH28F800BG-L/BGH-L offer two levels of protection
: absolute protection with V
hardware boot block locking. These alternatives
give designers ultimate control of their code security
needs.
FEATURES
• SmartVoltage technology
• High performance read access time
• Enhanced automated suspend options
LH28F800BG-L/BGH-L
(FOR TSOP, CSP)
In the absence of confirmation by device specification sheets, SHARP takes no responsibility for any defects that may occur in equipment using any SHARP devices shown in catalogs, data books,
etc. Contact SHARP in order to obtain the latest device specification sheets before using any SHARP device.
– 2.7 V, 3.3 V or 5 V V
– 2.7 V, 3.3 V, 5 V or 12 V V
LH28F800BG-L85/BGH-L85
– 85 ns (5.0±0.25 V)/90 ns (5.0±0.5 V)/
LH28F800BG-L12/BGH-L12
– 120 ns (5.0±0.5 V)/130 ns (3.3±0.3 V)/
– Word write suspend to read
– Block erase suspend to word write
– Block erase suspend to read
100 ns (3.3±0.3 V)/120 ns (2.7 to 3.6 V)
150 ns (2.7 to 3.6 V)
boot,
parameter
CC
= 2.7 V and V
CC
PP
and
at GND, selective
PP
PP
= 2.7 V. Their
main-blocked
- 1 -
• Enhanced data protection features
• SRAM-compatible write interface
• Optimized array blocking architecture
• Enhanced cycling capability
• Low power management
• Automated word write and block erase
• ETOX
• Packages
ETOX is a trademark of Intel Corporation.
8 M-bit (512 kB x 16) SmartVoltage
LH28F800BG-L/BGH-L (FOR TSOP, CSP)
– Absolute protection with V
– Block erase/word write lockout during power
– Boot blocks protection with WP# = V
– Two 4 k-word boot blocks
– Six 4 k-word parameter blocks
– Fifteen 32 k-word main blocks
– Top or bottom boot location
– 100 000 block erase cycles
– Deep power-down mode
– Automatic power saving mode decreases I
– Command user interface
– Status register
– 48-pin TSOP Type I (TSOP048-P-1220)
– 48-ball CSP (FBGA048-P-0808)
transitions
in static mode
TM
V nonvolatile flash technology
Normal bend/Reverse bend
Flash Memories
PP
= GND
IL
CC

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lh28f800bg-l Summary of contents

Page 1

... For secure code storage applications, such as networking, where code is either directly executed out of flash or downloaded to DRAM, the LH28F800BG-L/BGH-L offer two levels of protection : absolute protection with V PP hardware boot block locking. These alternatives give designers ultimate control of their code security needs ...

Page 2

... COMPARISON TABLE OPERATING VERSIONS TEMPERATURE LH28F800BG +70°C (FOR TSOP, CSP) LH28F800BGH-L –40 to +85°C (FOR TSOP, CSP) 1 LH28F800BG +70°C (FOR SOP) 1 Refer to the datasheet of LH28F800BG-L (FOR SOP). PIN CONNECTIONS 48-PIN TSOP (Type ...

Page 3

... BUFFER ADDRESS X LATCH DECODER ADDRESS COUNTER LH28F800BG-L/BGH-L (FOR TSOP, CSP) Parameter Blocks : The boot block architecture includes parameter blocks to facilitate storage of frequently update small parameters that would normally require an EEPROM. By using software techniques, EEPROMs can be emulated. Each boot block component contains six parameter blocks words (4 096 words) each ...

Page 4

... GND SUPPLY GROUND : Do not float any ground pins CONNECT : Lead is not internal connected; recommend to be floated. LH28F800BG-L/BGH-L (FOR TSOP, CSP) NAME AND FUNCTION produce spurious results and should not be attempted. HH ≤ memory contents cannot be altered. Block erase and ...

Page 5

... V V consumes approximately one-fifth the CC power and 3 approximately one-fourth the power LH28F800BG-L/BGH-L (FOR TSOP, CSP) But performance. V eliminates the need for a separate 12 V converter, while maximizes block erase and word PP = write performance. In addition to flexible erase and ...

Page 6

... LH28F800BG-L/BGH-L (FOR TSOP, CSP) The access time voltage range of 4.75 to 5.25 V over the temperature range +70°C (LH28F800BG-L)/ – +85°C (LH28F800BGH-L). At 4 order the access time 120 ns ...

Page 7

... Main Block 10000 0FFFF 32 k-Word Main Block 08000 07FFF 32 k-Word Main Block 00000 NOTES : BLOCK CONFIGURATION LH28F800BG-TL Top Boot LH28F800BGH-TL LH28F800BG-BL Bottom Boot LH28F800BGH-BL LH28F800BG-L/BGH-L (FOR TSOP, CSP) 7FFFF 0 78000 77FFF 1 70000 6FFFF 0 68000 67FFF 1 60000 5FFFF 2 58000 57FFF ...

Page 8

... Read Array command. Block erase suspend allows system software to suspend a block erase to read/write data from/to blocks other than that which is suspended. Word write suspend allows system LH28F800BG-L/BGH-L (FOR TSOP, CSP) software to suspend a word write to read data from any other flash memory array location. 2.1 Data Protection ...

Page 9

... RP# goes to logic-high (V IH command can be written. As with any automated device important to LH28F800BG-L/BGH-L (FOR TSOP, CSP) assert RP# during system reset. When the system comes out of reset, it expects to read from the flash memory. Automated flash memories provide status information when accessed during block erase ...

Page 10

... when the WSM is not busy, in block erase suspend mode (with word write inactive), word write suspend mode or deep power-down mode. LH28F800BG-L/BGH-L (FOR TSOP, CSP) 4 COMMAND DEFINITIONS When the V from the status register, identifier codes, or blocks are enabled ...

Page 11

... ID = Data read from identifier codes. 4. Following the Read Identifier Codes command, read operations access manufacture and device codes. See Section 4.2 for read identifier code data. LH28F800BG-L/BGH-L (FOR TSOP, CSP) Table 3 Command Definitions FIRST BUS CYCLE NOTE (NOTE 1) (NOTE 2) ’ ...

Page 12

... The status register contents are latched on LH28F800BG-L/BGH-L (FOR TSOP, CSP) the falling edge of OE# or CE#, whichever occurs. OE# or CE# must toggle update the status register latch. The Read Status ...

Page 13

... WSM verify only detects errors for "1"s that do not successfully write to "0"s. The CUI remains in read status register mode until it receives another command. LH28F800BG-L/BGH-L (FOR TSOP, CSP) Reliable word writes can only occur when V V and V CC1/2/3/4 this high voltage, memory contents are protected against word writes ...

Page 14

... RY/BY# will return After the Word Write Resume command is OL LH28F800BG-L/BGH-L (FOR TSOP, CSP) written, the device automatically outputs status register data when read (see Fig. 6). V remain at V word write) while in word write suspend mode. RP# must also remain at V level used for word write) ...

Page 15

... PP SR.2 = WORD WRITE SUSPEND STATUS (WWSS Word Write Suspended 0 = Word Write in Progress/Completed SR.1 = DEVICE PROTECT STATUS (DPS WP# or RP# Lock Detected, Operation Abort 0 = Unlock SR.0 = RESERVED FOR FUTURE ENHANCEMENTS (R) LH28F800BG-L/BGH-L (FOR TSOP, CSP) EFFECT Table 6 Status Register Definition WWS VPPS 4 3 NOTES : Check RY/BY# or SR.7 to determine block erase or word write completion ...

Page 16

... Command Sequence SR. Error 0 1 Block Erase SR.5 = Error 0 Block Erase Successful Fig. 3 Automated Block Erase Flowchart LH28F800BG-L/BGH-L (FOR TSOP, CSP) BUS COMMAND COMMENTS OPERATION Data = 20H Write Erase Setup Addr = Within Block to be Erased Erase Data = D0H Write Confirm Addr = Within Block to be Erased ...

Page 17

... SR.1 = Device Protect Error 0 1 SR.4 = Word Write Error 0 Word Write Successful Fig. 4 Automated Word Write Flowchart LH28F800BG-L/BGH-L (FOR TSOP, CSP) BUS COMMAND COMMENTS OPERATION Setup Data = 40H or 10H Write Word Write Addr = Location to be Written Data = Data to be Written Write ...

Page 18

... Word Write? Read Array Data Word Write Loop No Done? Yes Write D0H Write FFH Block Erase Resumed Array Data Fig. 5 Block Erase Suspend/Resume Flowchart LH28F800BG-L/BGH-L (FOR TSOP, CSP) BUS COMMAND OPERATION Erase Write Suspend Read Standby Standby Erase Write Resume ...

Page 19

... Read Array Data No Done Reading Yes Write D0H Write FFH Read Word Write Resumed Array Data Fig. 6 Word Write Suspend/Resume Flowchart LH28F800BG-L/BGH-L (FOR TSOP, CSP) BUS COMMAND COMMENTS OPERATION Word Write Data = B0H Write Suspend Addr = X Status Register Data Read Addr = X Check SR ...

Page 20

... LH28F800BG-L/BGH-L (FOR TSOP, CSP) and transient peaks produced by falling and rising edges of CE# and OE#. Transient current magnitudes depend on the device outputs’ capacitive and inductive loading. Two-line control and proper decoupling capacitor selection will suppress transient voltage peaks ...

Page 21

... WP# provides additional protection from inadvertent code or data alteration. The device is disabled while RP regardless of its control inputs IL state. LH28F800BG-L/BGH-L (FOR TSOP, CSP) 5.7 Power Consumption or CE# PP When designing portable systems, designers must consider battery power consumption not only during device operation, but also for data retention during ...

Page 22

... Supply Voltage (5.0±0.5 V) CC4 CC NOTE : 1. Test condition : Ambient temperature LH28F800BG-L/BGH-L (FOR TSOP, CSP) NOTICE : The specifications are subject to change without notice. Verify with your local SHARP sales office that you have the latest datasheet before finalizing a design. WARNING : Stressing the device beyond the ...

Page 23

... Fig. 8 Transient Input/Output Reference Waveform for V V 2.4 INPUT 0.45 AC test inputs are driven at V begins and V IH TTL 90%) < 10 ns. Fig. 9 Transient Input/Output Reference Waveform for LH28F800BG-L/BGH-L (FOR TSOP, CSP + MHz ˚ A TYP. MAX 1.35 TEST POINTS 1 ...

Page 24

... Includes Jig L Capacitance Fig. 10 Transient Equivalent Testing Load Circuit LH28F800BG-L/BGH-L (FOR TSOP, CSP) Test Configuration Capacitance Loading Value TEST CONFIGURATION V = 3.3±0.3 V, 2 (NOTE 5.0±0. 5.0±0 NOTE : 1. Applied to high-speed products, LH28F800BG-L85 and LH28F800BGH-L85. OUT - (pF 100 ...

Page 25

... PP I PPD Current I V Word Write Current PPW Block Erase Current PPE Word Write or Block PPWS PP I Erase Suspend Current PPES LH28F800BG-L/BGH-L (FOR TSOP, CSP 2 5.0±0 NOTE TYP. MAX. TYP. 1 ±0.5 1 ±0 0.2 2 0.4 4 ...

Page 26

... Block erases and word writes are inhibited when and not guaranteed in the range between V PPLK (max.) and V (min.), between V PPH1 V (min.), between V (max.) and V PPH2 PPH2 and above V (max.). PPH3 LH28F800BG-L/BGH-L (FOR TSOP, CSP 2 5.0±0 NOTE MIN. MAX. MIN. 7 –0.5 0.8 –0.5 V ...

Page 27

... OE# Change, Whichever Occurs First NOTES : 1. See AC Input/Output Reference Waveform (Fig. 7 through Fig. 9) for maximum allowable input slew rate. 2. OE# may be delayed ELQV 3. Sampled, not 100% tested. LH28F800BG-L/BGH-L (FOR TSOP, CSP –40 to +85 C ˚ ˚ LH28F800BG-L85 LH28F800BGH-L85 NOTE MIN ...

Page 28

... CE# without impact on t ELQV 3. Sampled, not 100% tested. 4. See Fig. 8 "Transient Input/Output Reference Waveform" and Fig. 10 "Transient Equivalent Testing Load Circuit" (High Speed Configuration) for testing characteristics. LH28F800BG-L/BGH-L (FOR TSOP, CSP +70˚C or –40 to +85 C ˚ (NOTE 4) LH28F800BG-L85 V ± ...

Page 29

... WE# ( High Z DATA (D/Q) (DQ - RP# ( Fig Waveform for Read Operations LH28F800BG-L/BGH-L (FOR TSOP, CSP) Device Data Valid Address Selection Address Stable t AVAV t GLQV t ELQV t GLQX t ELQX Valid Output t AVQV t PHQV - EHQZ ...

Page 30

... Refer to Section 6.2.4 "AC CHARAC- TERISTICS" for read-only operations. 2. Sampled, not 100% tested. 3. Refer to Table 3 for valid A and D IN word write. LH28F800BG-L/BGH-L (FOR TSOP, CSP) (NOTE –40 to +85 C ˚ ˚ LH28F800BG-L85 LH28F800BGH-L85 NOTE MIN ...

Page 31

... Read timing characteristics during block erase and word write operations are the same as during read-only operations. Refer to Section 6.2.4 "AC CHARAC- TERISTICS" for read-only operations. 2. Sampled, not 100% tested. 3. Refer to Table 3 for valid A and D IN word write. LH28F800BG-L/BGH-L (FOR TSOP, CSP) C ˚ LH28F800BG-L85 LH28F800BGH-L85 NOTE MIN. 100 2 ...

Page 32

... V (and if necessary RP# PP PPH1/2/3 should be held until determination of block erase HH or word write success (SR.1/3/4 Boot Blocks, SR.3/4 Parameter Blocks and Main Blocks). LH28F800BG-L/BGH-L (FOR TSOP, CSP +70˚C or –40 to +85 C ˚ (NOTE 5) LH28F800BG-L85 V ±0. ...

Page 33

... Write block erase or word write setup. 3. Write block erase confirm or valid address and data. 4. Automated erase or program delay. 5. Read status register data. 6. Write Read Array command. Fig Waveform for WE#-Controlled Write Operations LH28F800BG-L/BGH-L (FOR TSOP, CSP) (NOTE 3) (NOTE 4) (NOTE ...

Page 34

... In systems where CE# defines the write pulse width (within a longer WE# timing waveform), all setup, hold, and inactive WE# times should be measured relative to the CE# waveform. 2. Sampled, not 100% tested. 3. Refer to Table 3 for valid A and D IN word write. LH28F800BG-L/BGH-L (FOR TSOP, CSP) (NOTE 1) C ˚ LH28F800BG-L85 LH28F800BGH-L85 NOTE MIN. 120 ...

Page 35

... In systems where CE# defines the write pulse width (within a longer WE# timing waveform), all setup, hold, and inactive WE# times should be measured relative to the CE# waveform. 2. Sampled, not 100% tested. 3. Refer to Table 3 for valid A and D IN word write. LH28F800BG-L/BGH-L (FOR TSOP, CSP) C ˚ LH28F800BG-L85 LH28F800BGH-L85 NOTE MIN. 100 2 ...

Page 36

... V (and if necessary RP# PP PPH1/2/3 should be held until determination of block erase HH or word write success (SR.1/3/4 Boot Blocks, SR.3/4 Parameter Blocks and Main Blocks). LH28F800BG-L/BGH-L (FOR TSOP, CSP +70˚C or –40 to +85 C ˚ (NOTE 5) LH28F800BG-L85 V ±0. ...

Page 37

... Write block erase or word write setup. 3. Write block erase confirm or valid address and data. 4. Automated erase or program delay. 5. Read status register data. 6. Write Read Array command. Fig Waveform for CE#-Controlled Write Operations LH28F800BG-L/BGH-L (FOR TSOP, CSP) (NOTE 3) (NOTE 4) (NOTE ...

Page 38

... These specifications are valid for all product versions (packages and speeds RP# is asserted while a block erase or word write operation is not executing, the reset will complete within 100 ns. LH28F800BG-L/BGH-L (FOR TSOP, CSP) PLPH (A) Reset During Read Array Mode t PLRH PLPH ...

Page 39

... EHRH1 t Erase Suspend Latency WHRH2 t Time to Read EHRH2 NOTES : 1. Typical values measured +25˚C and nominal A voltages. Subject to change based on device characterization. 2. Excludes system-level overhead. LH28F800BG-L/BGH-L (FOR TSOP, CSP) C ˚ 2 5.0±0 (NOTE 1) MIN. TYP. MAX. MIN. TYP ...

Page 40

... EHRH1 t WHRH2 Erase Suspend Latency Time to Read t EHRH2 NOTES : 1. Typical values measured +25˚C and nominal A voltages. Subject to change based on device characterization. 2. Excludes system-level overhead. LH28F800BG-L/BGH-L (FOR TSOP, CSP +70˚C or –40 to +85 C ˚ NOTE MIN. TYP ...

Page 41

... Blank = – + OPTION ORDER CODE 1.35 V I/O Levels 1 LH28F800BGXX-XL85 2 LH28F800BGXX-XL12 LH28F800BG-L/BGH-L (FOR TSOP, CSP Access Speed (ns (5.0 0.25 V (5.0 0 120 ns (5.0 0.5 V), 130 ns (3.3 0.3 V), Block Locate Option T = Top Boot B = Bottom Boot Package E = 48-pin TSOP (I) (TSOP048-P-1220) Normal bend ...

Page 42

TSOP (TSOP048-P-1220 20.0 0.3 18.4 0.2 Package base plane 0.1 19.0 PACKAGING ...

Page 43

CSP (FBGA048-P-0808) 0.1 S 0.8 0 0.1 S TYP. 0 0.2 8 TYP. TYP 1.2 0.03 0. PACKAGING Land hole ...

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