S9S08DZ60F2MLH Freescale Semiconductor, S9S08DZ60F2MLH Datasheet - Page 389

no-image

S9S08DZ60F2MLH

Manufacturer Part Number
S9S08DZ60F2MLH
Description
8-bit Microcontrollers - MCU M74K MASK ONLY-AUTO
Manufacturer
Freescale Semiconductor
Datasheet

Specifications of S9S08DZ60F2MLH

Rohs
yes
Core
HCS08
Processor Series
MC9S08DZ60
Data Bus Width
8 bit
Maximum Clock Frequency
40 MHz
Program Memory Size
60 KB
Data Ram Size
4 K
On-chip Adc
Yes
Operating Supply Voltage
2.7 V to 5.5 V
Operating Temperature Range
- 40 C to + 125 C
Package / Case
LQFP-64
Mounting Style
SMD/SMT

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
S9S08DZ60F2MLH
Manufacturer:
Freescale
Quantity:
274
Part Number:
S9S08DZ60F2MLH
Manufacturer:
FREESCALE
Quantity:
5 928
Part Number:
S9S08DZ60F2MLH
Manufacturer:
Freescale Semiconductor
Quantity:
10 000
Part Number:
S9S08DZ60F2MLH
Manufacturer:
FREESCALE
Quantity:
5 928
Part Number:
S9S08DZ60F2MLH
Manufacturer:
QFP64
Quantity:
20 000
Part Number:
S9S08DZ60F2MLH
0
Company:
Part Number:
S9S08DZ60F2MLH
Quantity:
238
Part Number:
S9S08DZ60F2MLHR
Manufacturer:
FREESCALE
Quantity:
20 000
A.13 Flash and EEPROM
This section provides details about program/erase times and program-erase endurance for the Flash and
EEPROM memory.
Program and erase operations do not require any special power sources other than the normal V
For more detailed information about program/erase operations, see
Freescale Semiconductor
1
2
3
4
Num
The frequency of this clock is controlled by a software setting.
These values are hardware state machine controlled. User code does not need to count cycles. This information supplied for
calculating approximate time to program and erase.
Typical endurance for Flash and EEPROM is based on the intrinsic bit cell performance. For additional information on how
Freescale Semiconductor defines typical endurance, please refer to Engineering Bulletin EB619, Typical Endurance for
Nonvolatile Memory.
Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated
to 25°C using the Arrhenius equation. For additional information on how Freescale Semiconductor defines typical data
retention, please refer to Engineering Bulletin EB618, Typical Data Retention for Nonvolatile Memory.
10
11
1
2
3
4
5
6
7
8
9
C
C
C
C
Supply voltage for program/erase
Supply voltage for read operation
Internal FCLK frequency
Internal FCLK period (1/FCLK)
Byte program time (random location)
Byte program time (burst mode)
Page erase time
Mass erase time
Flash Program/erase endurance
EEPROM Program/erase endurance
Data retention
0 < f
0 < f
T
T = 25°C
T
T
T = 25°C
L
L
L
to T
to T
to T
Bus
Bus
H
H
H
< 20 MHz
< 8 MHz
= –40°C to + 125°C
= –40°C to + 0°C
= 0°C to + 125°C
4
2
(2)
Rating
Table A-17. Flash and EEPROM Characteristics
1
MC9S08DZ60 Series Data Sheet, Rev. 4
(2)
3
3
(2)
V
Symbol
prog/erase
n
V
n
f
t
t
t
t
t
t
FCLK
D_ret
Burst
Page
Mass
EEPE
Fcyc
FLPE
prog
Read
10,000
10,000
50,000
150
Min
2.7
2.7
15
5
Chapter 4,
100,000
100,000
Typical
20,000
4000
100
Appendix A Electrical Characteristics
9
4
“Memory.”
6.67
Max
200
5.5
5.5
DD
cycles
cycles
years
supply.
t
t
t
t
Unit
kHz
Fcyc
Fcyc
Fcyc
Fcyc
μs
V
V
389

Related parts for S9S08DZ60F2MLH