27C040 FAIRCHILD [Fairchild Semiconductor], 27C040 Datasheet - Page 4

• Manufacturer Part Number: 27C040
• Description: 4,194,304-Bit (512K x 8) High Performance CMOS EPROM
• Manufacturer: FAIRCHILD [Fairchild Semiconductor]

NM27C040 Rev. C.1
AC Test Conditions
Output Load
Input Rise and Fall Times
Input Pulse Levels
Timing Measurement Reference Level (Note 10)
AC Waveforms
Note 1: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of
the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions
for extended periods may affect device reliability.
Note 2: This parameter is only sampled and is not 100% tested.
Note 3: OE may be delayed up to t
Note 4: The t
High to TRI-STATE
Low to TRI-STATE, the measured V
Note 5: TRI-STATE may be attained using OE or CE .
Note 6: The power switching characteristics of EPROMs require careful device decoupling. It is recommended that at least a 0.1 F ceramic capacitor be used on every device
between V
Note 7: The outputs must be restricted to V
Note 8: 1 TTL Gate: I
C
Note 9: V
Note 10: Inputs and outputs can undershoot to -2.0V for 20 ns Max.
L
: 100 pF includes fixture capacitance.
Inputs
Outputs`
CC
PP
and GND.
may be connected to V
DF
ADDRESSES
and t
®
, the measured V
OUTPUT
CF
OL
compare level is determined as follows:
= 1.6 mA, I
OE
CE
(Notes 6, 7, 9)
1 TTL Gate and C
0.8V
2V
2V
0.8V
2V
0.8V
2V
0.8V
ACC
OL1
OH
CC
OH1
= -400 A.
except during programming.
(DC) + 0.10V.
- t
(DC) - 0.10V;
OE
CC
after the falling edge of CE without impacting t
+ 1.0V to avoid latch-up and device damage.
Hi-Z
L
= 100 pF (Note 8)
(Note 3)
t
0.45V to 2.4V
ACC
0.8V and 2V
0.8V and 2V
Addresses Valid
t CE
(Note 3)
5 ns
t OE
4
ACC
Valid Output
.
t OH
(Note 4, 5)
(Note 4, 5)
t
t DF
CF
Hi-Z
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DS010836-4