ADP1046-100-EVALZ AD [Analog Devices], ADP1046-100-EVALZ Datasheet - Page 9

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ADP1046-100-EVALZ

Manufacturer Part Number
ADP1046-100-EVALZ
Description
Digital Controller for Isolated
Manufacturer
AD [Analog Devices]
Datasheet
Data Sheet
Parameter
EEPROM RELIABILITY
1
2
Timing Diagram
Endurance is qualified as per JEDEC Standard 22, Method A117, and is measured at −40°C, +25°C, +85°C, and +125°C. Endurance conditions are subject to change
pending EEPROM qualification.
Retention lifetime equivalent at junction temperature (T
temperature T
Endurance
Data Retention
SDA
SCL
J
1
= 125°C is 2.87 years and is subject to change pending EEPROM qualification.
P
2
t
BUF
S
t
HD;STA
t
LOW
Symbol
t
R
t
HD;DAT
J
) = 85°C as per JEDEC Standard 22, Method A117. The derated retention lifetime equivalent at junction
Test Conditions/Comments
T
T
T
T
J
J
J
J
= 85°C
= 125°C
= 85°C
= 125°C
t
HIGH
Figure 3. Serial Bus Timing Diagram
t
F
t
SU;DAT
Rev. 0 | Page 9 of 96
S
t
SU;STA
t
HD;STA
Min
10,000
1000
20
10
Typ
t
SU;STO
Max
P
ADP1046
Unit
Cycles
Cycles
Years
Years

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