LH28F160S5-L SHARP [Sharp Electrionic Components], LH28F160S5-L Datasheet - Page 36

• Manufacturer Part Number: LH28F160S5-L
• Description: 16 M-bit (2 MB x 8/1 MB x 16) Smart 5 Flash Memories (Fast Programming)
• Manufacturer: SHARP [Sharp Electrionic Components]

6.2.2 AC INPUT/OUTPUT TEST CONDITIONS
DEVICE
Fig. 14 Transient Equivalent Testing
UNDER
TEST
AC test inputs are driven at 3.0 V for a Logic "1" and 0.0 V for a Logic "0". Input timing begins, and output
timing ends, at 1.5 V. Input rise and fall times (10% to 90%) < 10 ns.
AC test inputs are driven at V
begins at V
to 90%) < 10 ns.
C
L
Capacitance
Includes Jig
0.45
3.0
0.0
2.4
Fig. 12 Transient Input/Output Reference Waveform for V
IH
Fig. 13 Transient Input/Output Reference Waveform for V
(2.0 V
INPUT
Load Circuit
INPUT
TTL
1.3 V
) and V
R
C
1N914
L
L
OH
IL
= 3.3 k
(0.8 V
(2.4 V
1.5
TTL
(High Speed Testing Configuration)
2.0
0.8
(Standard Testing Configuration)
TTL
). Output timing ends at V
OUT
) for a Logic "1" and V
- 36 -
TEST POINTS
TEST POINTS
NOTE :
1. Applied to high-speed products, LH28F160S5-L70 and
V
V
CC
CC
Test Configuration Capacitance Loading Value
LH28F160S5H-L70.
= 5.0±0.25 V
= 5.0±0.5 V
TEST CONFIGURATION
OL
IH
(0.45 V
and V
TTL
IL
. Input rise and fall times (10%
(NOTE 1)
) for a Logic "0". Input timing
CC
CC
1.5
= 5.0±0.25 V
= 5.0±0.5 V
2.0
0.8
OUTPUT
OUTPUT
LH28F160S5-L/S5H-L
CL (pF)
100
30