mc9s12uf32 Freescale Semiconductor, Inc, mc9s12uf32 Datasheet - Page 100

• Manufacturer Part Number: mc9s12uf32
• Description: System Chip Guide V01.05
• Manufacturer: Freescale Semiconductor, Inc

System on a Chip Guide — 9S12UF32DGV1/D V01.05
A device will be defined as a failure if after exposure to ESD pulses, the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
specification at room temperature followed by hot temperature unless specified otherwise in the device
specification.
A.1.7 Operating Conditions
This chapter describes the operating conditions of the device. Unless otherwise noted those conditions
apply to all the following data.
100
Num C
1
2
3
Human Body
Machine
Latch-up
Model
C Human Body Model (HBM)
C Machine Model (MM)
C
Latch-up Current at T
positive
negative
Table A-3 ESD and Latch-Up Protection Characteristics
Series Resistance
Storage Capacitance
Number of Pulse per pin
positive
negative
Series Resistance
Storage Capacitance
Number of Pulse per pin
positive
negative
Minimum input voltage limit
Maximum input voltage limit
Table A-2 ESD and Latch-up Test Conditions
A
Rating
= 70 C
Description
Symbol
V
V
I
HBM
LAT
MM
Symbol
R1
R1
C
C
-
-
2000
+100
-100
Min
200
Freescale Semiconductor
Value
1500
100
200
-2.5
7.5
1
1
0
1
1
-
-
Max
-
-
-
Unit
Ohm
Ohm
pF
pF
V
V
Unit
mA
V
V