MIL-PRF-19500 STMicroelectronics, MIL-PRF-19500 Datasheet - Page 8

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MIL-PRF-19500

Manufacturer Part Number
MIL-PRF-19500
Description
SEMICONDUCTOR DEVICE/ TRANSISTOR/ NPN/ SILICON/ LOW-POWER TYPES 2N2484/ 2N2484UA/ 2N2484UB/ JAN/ JANTX/ JANTXV/ JANS/ JANHC/ AND JANKC
Manufacturer
STMicroelectronics
Datasheet
MIL-PRF-19500.
manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturer’s list (QML)
before contract award (see 4.2 and 6.3).
specified in MIL-PRF-19500.
19500 and figures 1, 2, 3, 4, and 5 herein.
and herein.
may be omitted from the body, but shall be retained on the initial container.
characteristics are as specified in 1.3, 1.4, and table I.
herein.
shall be free from other defects that will affect life, serviceability, or appearance.
specified herein.
MIL-PRF-19500.
3. REQUIREMENTS
3.1 General. The requirements for acquiring the product described herein shall consist of this document and
3.2 Qualification. Devices furnished under this specification shall be products that are manufactured by a
3.3 Abbreviations, symbols, and definitions. Abbreviations, symbols, and definitions used herein shall be as
3.4 Interface and physical dimensions. The interface and physical dimensions shall be as specified in MIL-PRF-
3.4.1 Lead finish. Unless otherwise specified, lead finish shall be solderable in accordance with MIL-PRF-19500,
3.5 Marking. Marking shall be in accordance with MIL-PRF-19500. At the option of the manufacturer, marking
3.6 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance
3.7 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table I
4. VERIFICATION
4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as
4.2.1. JANHC and JANKC Qualification. JANHC and JANKC qualification inspection shall be in accordance with
3.8 Workmanship. Semiconductor devices shall be processed in such a manner as to be uniform in quality and
a. Qualification inspection (see 4.2).
b. Screening (see 4.3).
c. Conformance inspection (see 4.4).
MIL-PRF-19500/376E
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