MIL-PRF-19500 STMicroelectronics, MIL-PRF-19500 Datasheet - Page 16

• Manufacturer Part Number: MIL-PRF-19500
• Description: SEMICONDUCTOR DEVICE/ TRANSISTOR/ NPN/ SILICON/ LOW-POWER TYPES 2N2484/ 2N2484UA/ 2N2484UB/ JAN/ JANTX/ JANTXV/ JANS/ JANHC/ AND JANKC
• Manufacturer: STMicroelectronics

1/
2/
3/
4/
5/
1
2.
3.
Step
The delta measurements for group B, table VIa (JANS) of MIL-PRF-19500 are as follows:
a.
b.
The delta measurements for 4.4.2.2 herein (group B, JAN, JANTX, and JANTXV) are as follows: Steps 2
and 3 of table III shall be performed after each step in 4.4.2.2 herein.
The delta measurements for group C, table VII of MIL-PRF-19500 are as follows: Subgroup 6, see table III
herein, steps 1 and 3 for JANS, step 1 for JAN, JANTX, and JANTXV.
Devices which exceed the group A limits for this test shall not be accepted.
Applies to JANS level only.
Forward-current transfer
ratio
Collector to emitter
voltage (saturated)
Collector to emitter
cutoff current
Subgroup 4, see table III herein, step 2.
Subgroup 5, see table III herein, steps 1 and 3.
Inspection
TABLE III. Groups B and C delta measurements. 1/ 2/ 3/
Method
3076
3071
3041
MIL-PRF-19500/376E
V
I
Bias condition C;
V
C
MIL-STD-750
A dc; pulsed see 4.5.1
A dc
CE
CB
= 1.0 mA dc; I
= 5 V dc; I
= 45 V dc
Conditions
16
C
B
= 500
= 100
4/ 5/
4/
Symbol
4/
h
V
I
CES
FE4
CE(sat)
initial recorded reading
previously measured value.
100 percent of initial value
or 2 nA dc, whichever is
greater.
25 percent change from
50 mV dc change from
Limit
Unit