MIL-PRF-19500 STMicroelectronics, MIL-PRF-19500 Datasheet - Page 15

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MIL-PRF-19500

Manufacturer Part Number
MIL-PRF-19500
Description
SEMICONDUCTOR DEVICE/ TRANSISTOR/ NPN/ SILICON/ LOW-POWER TYPES 2N2484/ 2N2484UA/ 2N2484UB/ JAN/ JANTX/ JANTXV/ JANS/ JANHC/ AND JANKC
Manufacturer
STMicroelectronics
Datasheet
Inspection
Subgroup 1
Temperature cycling
Hermetic seal
Electrical measurements
Subgroup 2
Intermittent life
Electrical measurements
Subgroup 3
Not applicable
Subgroup 4
Not applicable
Subgroup 5
Not applicable
(air to air)
Fine leak
Gross leak
TABLE II. Group E inspection (all quality levels) - For qualification only.
Method
1051
1071
1037
Test condition C, 500 cycles
See group A, subgroup 2 and table III herein.
Intermittent operation life: V
6,000 cycles.
See group A, subgroup 2 and table III herein.
MIL-PRF-19500/376E
15
MIL-STD-750
Conditions
CB
= 10 V dc ,
Qualification
12 devices
45 devices
c = 0
c = 0

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