MIL-PRF-19500 STMicroelectronics, MIL-PRF-19500 Datasheet - Page 14

• Manufacturer Part Number: MIL-PRF-19500
• Description: SEMICONDUCTOR DEVICE/ TRANSISTOR/ NPN/ SILICON/ LOW-POWER TYPES 2N2484/ 2N2484UA/ 2N2484UB/ JAN/ JANTX/ JANTXV/ JANS/ JANHC/ AND JANKC
• Manufacturer: STMicroelectronics

1/ For sampling plan see MIL-PRF-19500.
2/ For resubmission of failed subgroup A1, double the sample size of the failed test or sequence of tests. A
3/ Separate samples may be used.
4/ Not required for JANS devices.
5/ Not required for laser marked devices.
Subgroup 4 - continued.
Small-signal short- circuit
forward current transfer ratio
Open circuit output
capacitance
Input capacitance (output
open-circuited)
Noise figure
Noise figure
Noise figure
Noise figure (wideband)
Subgroups 5 and 6
Not applicable
Subgroup 7 4/
Decap internal visual (design
verification)
failure in group A, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun
upon submission.
Inspection 1/
Method
3206
3236
3240
3246
3246
3246
3246
2075
TABLE I. Group A inspection - Continued.
V
f = 1 kHz
V
100 kHz
V
100 kHz
f = 100 Hz; V
f = 1 kHz; V
f = 10 kHz; V
Noise bandwidth = 10 Hz to 15.7
kHz; V
R
n = 1 device, c = 0
A dc; R
A dc; R
A dc; R
CE
CB
EB
g
= 10 k ;
MIL-STD-750
= 0.5 V dc; I
= 5 V dc; I
= 5 V dc; I
MIL-PRF-19500/376E
CE
g
g
g
= 5 V dc; I
= 10 k ;
= 10 k ;
= 10 k ;
f
f
CE
Conditions
CE
CE
1 MHz
1 MHz
C
E
= 5 V dc; I
= 5 V dc; I
= 5 V dc; I
= 1 mA dc;
= 0;
C
14
= 0;
C
= 10 A dc;
C
C
C
= 10
= 10
= 10
Symbol
NF1
NF2
NF3
NF4
C
C
h
obo
fe
ibo
250
Min
Limit
Max
900
5.0
6.0
7.5
3
2
3
Unit
pF
pF
dB
dB
dB
dB