DT28F016SV-080 Intel Corporation, DT28F016SV-080 Datasheet - Page 27

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DT28F016SV-080

Manufacturer Part Number
DT28F016SV-080
Description
16-MBIT (1 MBIT x 16/ 2 MBIT x 8) FlashFile MEMORY
Manufacturer
Intel Corporation

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E
AC test inputs are driven at V
(2.0 VTTL) and V
AC test inputs are driven at 3.0V for a Logic “1” and 0.0V for a Logic “0.” Input timing begins, and output timing ends, at 1.5V.
Input rise and fall times (10% to 90%) <10 ns.
NOTES:
1.
2. Testing characteristics for 28F016SV-065/28F016SV-075 and 28F016SV-70 (High Speed Testing Configuration)/
Testing characteristics for 28F016SV-070 (Standard Testing Configuration) and 28F016SV-080.
28F016SV-120.
0.45
0.0
3.0
2.4
Figure 8. Transient Input/Output Reference Waveform for V
IL
(0.8 VTTL). Output timing ends at V
INPUT
INPUT
Figure 7. Transient Input/Output Reference Waveform for
and V
OH
V
(2.4 VTTL) for a Logic “1” and V
CC
CC
= 5V ± 10% (Standard Testing Configuration)
= 5V ± 5% (High Speed Testing Configuration)
1.5
2.0
0.8
IH
and V
TEST POINTS
TEST POINTS
IL
OL
. Input rise and fall times (10% to 90%) <10 ns.
(0.45 VTTL) for a Logic “0.” Input timing begins at V
28F016SV FlashFile™ MEMORY
CC
(1)
1.5
= 3.3V ± 0.3V
2.0
(2)
0.8
OUTPUT
OUTPUT
IH
0528_07
0528_08
27

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