MT55L1MY18P Micron Semiconductor Products, Inc., MT55L1MY18P Datasheet - Page 27

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MT55L1MY18P

Manufacturer Part Number
MT55L1MY18P
Description
18Mb ZBT SRAM, 3.3V Vdd, 2.5V or 3.3V I/O; 2.5V Vdd, 2.5V I/O, Pipelined,
Manufacturer
Micron Semiconductor Products, Inc.
Datasheet

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MT55L1MY18PF-10 ES
Manufacturer:
MICRON/美光
Quantity:
20 000
3.3V TAP AC Test Conditions
Input Pulse Levels .......................................... Vss to 3.0V
Input rise and fall times ..............................................1ns
Input timing reference levels.................................... 1.5V
Output reference levels ............................................. 1.5V
Test load termination supply voltage ...................... 1.5V
Table 20: 3.3V V
0ºC £ T
Table 21: 2.5V V
0ºC £ T
NOTE:
18Mb: 1 Meg x 18, 512K x 32/36 Pipelined ZBT SRAM
MT55L1MY18P_16_D.fm – Rev. D, Pub. 2/03
1. All voltages referenced to V
2. TAP control balls only. For boundary scan ball specifications, please refer to the I/O DC Electrical Characteristics and
DESCRIPTION
DESCRIPTION
Input High (Logic 1) Voltage
Input Low (Logic 0) Voltage
Input Leakage Current
Output Leakage Current
Output Low Voltage
Output High Voltage
Input High (Logic 1) Voltage
Input Low (Logic 0) Voltage
Input Leakage Current
Output Leakage Current
Output Low Voltage
Output High Voltage
3.3V TAP AC Output Load Equivalent
Operation Conditions tables.
A
A
£ +70ºC; V
£ +70ºC; V
TDO
DD
DD
= 3.3V ±0.165V unless otherwise noted
= 2.5V ±0.125V unless otherwise noted
Figure 18:
Z = 50
DD
DD
O
, TAP DC Electrical Characteristics and Operating Conditions
, TAP DC Electrical Characteristics and Operating Conditions
SS
(GND).
0V £ V
0V £ V
Output(s) disabled,
Output(s) disabled,
1.5V
0V £ V
CONDITIONS
I
0V £ V
CONDITIONS
I
I
OHC
I
OHC
I
OLC
I
OLC
I
OHT
I
OHT
OLT
OLT
IN
IN
20pF
50
= -100µA
= 100µA
= -100µA
£ V
= 100µA
£ V
= 2mA
= -2mA
= -2mA
= 2mA
IN
IN
£ V
DD
£ V
DD
(TDO)
DD
(TDO)
DD
27
SYMBOL
SYMBOL
2.5V TAP AC Test Conditions
Input Pulse Levels........................................... Vss to 2.5V
Input rise and fall times ............................................. 1ns
Input timing reference levels.................................. 1.25V
Output reference levels ........................................... 1.25V
Test load termination supply voltage .................... 1.25V
18Mb: 1 MEG x 18, 512K x 32/36
V
V
V
V
V
V
V
V
2.5V TAP AC Output Load Equivalent
V
V
IL
V
IL
IL
V
OH1
OH2
OL1
OL2
IL
OH1
OH2
OL1
OL2
IH
IL
IH
O
IL
O
I
I
Micron Technology, Inc., reserves the right to change products or specifications without notice.
MIN
MIN
TDO
-0.3
-10
-10
-0.3
2.0
2.9
2.0
-10
-10
1.7
2.1
1.7
PIPELINED ZBT SRAM
Figure 19:
V
V
Z = 50
DD
DD
MAX
MAX
O
0.8
0.7
0.8
10
10
0.2
0.7
0.7
10
10
+ 0.3
+ 0.3
UNITS
UNITS
1.25V
µA
µA
µA
µA
V
V
V
V
V
V
V
V
V
V
V
V
©2003 Micron Technology, Inc.
20pF
50
NOTES
NOTES
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
1, 2
2
2
2
2

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